ESP32 I2C Comprehensive Test Suite

Overview

This directory contains the comprehensive I2C test suite (I2cComprehensiveTest.cpp) for the ESP32 implementation. For complete documentation including test details, API reference, and usage examples, see:

📖 Complete I2C Documentation

Quick Test Information

Test File Location

  • Main Test File: examples/esp32/main/I2cComprehensiveTest.cpp
  • Test Framework: examples/esp32/main/TestFramework.h

Running the Tests

```bash

From project root

cd examples/esp32

Build the I2C test suite

./scripts/build_example.sh i2c_test Release

Flash and monitor

./scripts/flash_example.sh i2c_test Release flash_monitor ```text

Test Categories (24 Total)

The comprehensive test suite includes:

Core Functionality (10 tests)

  1. Bus initialization - Basic setup and configuration
  2. Bus deinitialization - Cleanup and state management
  3. Configuration validation - Clock sources and settings
  4. Device creation - 7-bit and 10-bit addressing
  5. Device management - Multi-device operations
  6. Device probing - Device detection
  7. Bus scanning - Device discovery
  8. Write operations - Data transmission
  9. Read operations - Data reception
  10. Write-read operations - Register access patterns

Advanced Features (8 tests)

  1. Error handling - Fault conditions and recovery
  2. Timeout handling - Timing validation
  3. Multi-device operations - Concurrent device access
  4. Clock speeds - Standard/Fast/Fast+ mode testing
  5. Address modes - 7-bit vs 10-bit addressing
  6. ESP-specific features - Clock sources, power management
  7. Thread safety - Concurrent access verification
  8. Performance - Timing and throughput measurement

New Features (6 tests)

  1. Edge cases - Boundary conditions and limits
  2. Power management - Sleep mode compatibility
  3. Async operations - Non-blocking I2C operations
  4. Async timeout handling - Async slot management
  5. Async multiple operations - Sequential async operations
  6. Index-based access - Device iteration and access methods

Expected Output

```text ╔══════════════════════════════════════════════════════════════════════════════╗ ║ ESP32-C6 I2C COMPREHENSIVE TEST SUITE ║ ║ HardFOC Internal Interface ║ ╚══════════════════════════════════════════════════════════════════════════════╝

═══════════════════════════════════════════════════════════════════ I2C Bus Initialization ═══════════════════════════════════════════════════════════════════ [SUCCESS] Bus initialization tests passed

// … 24 test categories …

Test Summary: I2C

Tests Run: 24 Passed: 24
Failed: 0 Success Rate: 100.00% ```text

Hardware Requirements

  • ESP32-C6 DevKit-M-1 (or compatible)
  • GPIO Configuration:
    • SDA: GPIO21
    • SCL: GPIO22
  • Optional: I2C devices for comprehensive testing

Test Configuration

The test suite uses these default configurations:

```cpp // GPIO pins static constexpr hf_pin_num_t TEST_SDA_PIN = 21; static constexpr hf_pin_num_t TEST_SCL_PIN = 22;

// Test device addresses static constexpr uint16_t TEST_DEVICE_ADDR_1 = 0x48; // Common device static constexpr uint16_t TEST_DEVICE_ADDR_2 = 0x50; // EEPROM static constexpr uint16_t NONEXISTENT_ADDR = 0x7E; // Non-existent

// Clock frequencies
static constexpr uint32_t STANDARD_FREQ = 100000; // 100kHz static constexpr uint32_t FAST_FREQ = 400000; // 400kHz static constexpr uint32_t FAST_PLUS_FREQ = 1000000; // 1MHz ```text

For Complete Documentation

📖 See Complete I2C Documentation for:

  • Complete API reference
  • Detailed test descriptions
  • Usage examples
  • Asynchronous operation details
  • Index-based access methods
  • Performance characteristics
  • Best practices and considerations