ESP32-C6 NVS Comprehensive Test Suite

Overview

The NVS Comprehensive Test Suite provides extensive validation of the EspNvs class for ESP32-C6 platforms using ESP-IDF v5.5+. This test suite demonstrates complete Non-Volatile Storage functionality, data persistence, error handling, and performance optimization with a focus on embedded environments using noexcept functions.

✅ Status: Successfully tested on ESP32-C6-DevKitM-1 hardware

The comprehensive test suite provides full coverage of the EspNvs class, testing all methods, error conditions, edge cases, and boundary conditions. The tests are designed to run without exceptions and without RTTI, making them suitable for embedded environments.

Test Coverage

The test suite covers:

  1. Initialization and Deinitialization
    • Normal initialization/deinitialization
    • Double initialization/deinitialization
    • Lazy initialization patterns
    • Error handling
  2. U32 Operations
    • Basic set/get operations
    • Boundary values (min/max)
    • Overwriting existing values
    • Invalid parameters (null pointers, empty keys)
    • Key length limits
  3. String Operations
    • Basic string storage/retrieval
    • Empty strings
    • Long strings
    • Buffer size validation
    • Special characters
  4. Blob Operations
    • Binary data storage/retrieval
    • Large blobs
    • Buffer size validation
    • Null bytes in data
  5. Key Management
    • Key existence checking
    • Key size retrieval
    • Key erasure
    • Invalid key handling
  6. Commit Operations
    • Normal commits
    • Multiple commits
    • Commits on uninitialized NVS
  7. Statistics and Diagnostics
    • Operation counting
    • Error tracking
    • Performance monitoring
    • Health diagnostics
  8. Metadata
    • Description retrieval
    • Namespace information
    • Maximum limits
  9. Edge Cases
    • Special characters in keys/values
    • Rapid successive operations
    • Type overwriting
    • Binary data with null bytes
  10. Stress Testing
    • Multiple namespaces
    • Large number of keys
    • Rapid init/deinit cycles
    • Mixed operation types

Hardware Requirements

Supported Platforms

  • Primary Target: ESP32-C6-DevKitM-1
  • ESP-IDF Version: v5.5 or later
  • Minimum Flash: 4MB
  • Minimum RAM: 256KB

Connections

  • USB: For flashing and serial monitoring (built-in USB-JTAG)
  • No External Hardware Required: All tests use internal NVS partition

Building and Running

Prerequisites

```bash

ESP-IDF v5.5+ installation required

. $IDF_PATH/export.sh

Set target platform

export IDF_TARGET=esp32c6 ```text

Quick Start

```bash

cd examples/esp32

Build NVS test

idf.py build -DEXAMPLE_TYPE=nvs_test -DBUILD_TYPE=Release

Flash and monitor

idf.py -p /dev/ttyUSB0 flash monitor ```text

Alternative Build Methods

```bash

Source ESP-IDF environment

source /path/to/esp-idf/export.sh

Build with optimization

./build_example.sh nvs_test Release

Flash to device

idf.py -B build_nvs_test_Release flash monitor ```text

Debug Build for Development

```bash

Build with debug symbols and verbose output

idf.py build -DEXAMPLE_TYPE=nvs_test -DBUILD_TYPE=Debug

Run with detailed logging

idf.py -p /dev/ttyUSB0 flash monitor ```text

Running the Test

Once flashed, the test will automatically start and run through all test cases. The output will show:

  • Progress for each test case
  • Pass/fail status for each test
  • Detailed error messages for any failures
  • Final summary with total tests, passed, failed, and execution time

Expected Output

```text ╔══════════════════════════════════════════════════════════════════════════════╗ ║ ESP32-C6 NVS COMPREHENSIVE TEST SUITE ║ ╚══════════════════════════════════════════════════════════════════════════════╝

╔══════════════════════════════════════════════════════════════════════════════╗ ║ Running: test_nvs_initialization ║ ╚══════════════════════════════════════════════════════════════════════════════╝ [SUCCESS] PASSED: test_nvs_initialization (XX.XX ms)

… (more tests) …

=== NVS TEST SUMMARY === Total: 10, Passed: 10, Failed: 0, Success: 100.00%, Time: XXX.XX ms [SUCCESS] ALL NVS TESTS PASSED! ```text

Troubleshooting

Common Issues

  1. NVS partition not found:
    • Ensure your partition table includes an NVS partition
    • Check sdkconfig for proper NVS configuration
  2. Initialization failures:
    • The NVS partition might be corrupted
    • Try erasing flash: idf.py -p /dev/ttyUSB0 erase-flash
  3. Test failures:
    • Check the detailed error messages in the output
    • Ensure sufficient free space in NVS partition
    • Verify ESP-IDF version is 5.5 or later

Configuration

The test uses the following compiler flags to ensure embedded-friendly code:

  • -fno-exceptions: No C++ exceptions
  • -fno-rtti: No Run-Time Type Information
  • -O2: Optimization level 2 for release builds
  • -Wall -Wextra: Enable most warnings

Customization

To add more tests or modify existing ones, edit: examples/esp32/main/NvsComprehensiveTest.cpp

The test framework in TestFramework.h provides:

  • Automatic timing measurement
  • Result tracking
  • Standardized output format

Notes

  • The test suite is designed to be self-contained and requires no external dependencies
  • All tests use the noexcept specifier to ensure no exceptions are thrown
  • The code is compatible with C++17 standard
  • Thread safety is enabled by default (HF_THREAD_SAFE=1)