Comprehensive PIO testing suite for ESP32-C6 DevKit-M-1 with RMT peripheral (noexcept) More...

#include "TestFramework.h"
#include "base/BasePio.h"
#include "mcu/esp32/EspGpio.h"
#include "mcu/esp32/EspPio.h"
#include "mcu/esp32/utils/EspTypes_PIO.h"

Include dependency graph for PioComprehensiveTest.cpp:

Classes
struct	CallbackTestData

Functions
void	TestTransmitCallback (hf_u8_t channel_id, size_t symbols_sent, void *user_data)

void	TestReceiveCallback (hf_u8_t channel_id, const hf_pio_symbol_t symbols, size_t symbol_count, void user_data)

void	TestErrorCallback (hf_u8_t channel_id, hf_pio_err_t error, void *user_data)

hf_pio_channel_config_t	create_test_channel_config (hf_gpio_num_t gpio_pin, hf_pio_direction_t direction=hf_pio_direction_t::Transmit) noexcept
	Create a default PIO channel configuration for testing using resolution_ns ESP32-C6 specific configuration for RMT compatibility with latest improvements.

void	create_ws2812_rgb_symbols (uint8_t r, uint8_t g, uint8_t b, hf_pio_symbol_t *symbols, uint32_t resolution_ns) noexcept
	Create WS2812 symbols for RGB data using resolution_ns timing.

hf_pio_symbol_t	create_ws2812_reset_symbol (uint32_t resolution_ns) noexcept
	Create WS2812 reset symbol using resolution_ns timing.

void	create_logic_analyzer_test_pattern (hf_pio_symbol_t *symbols, size_t &symbol_count, uint32_t resolution_ns) noexcept
	Create test pattern for logic analyzer verification using resolution_ns timing.

void	ensure_minimum_tick_duration (hf_pio_symbol_t *symbols, size_t symbol_count, uint32_t min_ticks=1) noexcept
	Ensure minimum tick duration for symbols to prevent "Duration too short" errors.

bool	test_esp32_variant_detection () noexcept

bool	test_channel_allocation_helpers () noexcept

bool	test_channel_direction_validation () noexcept

bool	test_resolution_ns_usage () noexcept

bool	test_constructor_default () noexcept

bool	test_destructor_cleanup () noexcept

bool	test_initialization_states () noexcept

bool	test_lazy_initialization () noexcept

bool	test_channel_configuration () noexcept

bool	test_multiple_channel_configuration () noexcept

bool	test_basic_symbol_transmission () noexcept

bool	test_transmission_edge_cases () noexcept

bool	test_ws2812_single_led () noexcept

bool	test_ws2812_multiple_leds () noexcept

bool	test_ws2812_color_cycle () noexcept

bool	test_ws2812_brightness_sweep () noexcept

bool	test_ws2812_pattern_validation () noexcept

bool	test_ws2812_rainbow_transition () noexcept

bool	test_logic_analyzer_patterns () noexcept

bool	test_frequency_sweep () noexcept

bool	test_rmt_encoder_configuration () noexcept

bool	test_rmt_carrier_modulation () noexcept

bool	test_rmt_advanced_configuration () noexcept

bool	test_loopback_functionality () noexcept

bool	test_hardware_loopback_gpio8_to_gpio18 () noexcept

bool	test_callback_functionality () noexcept

bool	test_statistics_and_diagnostics () noexcept

bool	test_stress_transmission () noexcept

bool	test_pio_system_validation () noexcept

void	app_main ()

Variables
static const char *	TAG = "PIO_Test"

static TestResults	g_test_results

static constexpr bool	ENABLE_CORE_TESTS = true

static constexpr bool	ENABLE_VARIANT_TESTS = true

static constexpr bool	ENABLE_CHANNEL_TESTS = true

static constexpr bool	ENABLE_TRANSMISSION_TESTS = true

static constexpr bool	ENABLE_WS2812_TESTS = true

static constexpr bool	ENABLE_ANALYZER_TESTS = true

static constexpr bool	ENABLE_ADVANCED_TESTS = true

static constexpr bool	ENABLE_LOOPBACK_TESTS = true

static constexpr bool	ENABLE_CALLBACK_TESTS = true

static constexpr bool	ENABLE_DIAGNOSTIC_TESTS = true

static constexpr bool	ENABLE_STRESS_TESTS = true

static constexpr uint32_t	WS2812_T0H = 350

static constexpr uint32_t	WS2812_T0L = 900

static constexpr uint32_t	WS2812_T1H = 700

static constexpr uint32_t	WS2812_T1L = 600

static constexpr uint32_t	WS2812_RESET = 50000

static constexpr hf_gpio_num_t	TEST_GPIO_TX = 8

static constexpr hf_gpio_num_t	TEST_GPIO_RX = 18

static constexpr uint32_t	TEST_RESOLUTION_WS2812_NS = 125

static constexpr uint32_t	TEST_RESOLUTION_STANDARD_NS = 500

static constexpr uint32_t	TEST_RESOLUTION_LOW_NS = 10000

static CallbackTestData	g_callback_data [HF_RMT_MAX_CHANNELS] = {}

Detailed Description

Comprehensive PIO testing suite for ESP32-C6 DevKit-M-1 with RMT peripheral (noexcept)

This comprehensive test suite validates all functionality of the EspPio class using ESP-IDF v5.5 RMT with the latest improvements including:

Channel-specific callback system with proper user data handling
Resolution_ns user interface with internal conversion to resolution_hz
ESP32 variant-specific channel validation (TX/RX allocation per variant)
Enhanced clock divider calculation with overflow protection
Constructor/Destructor behavior
Lifecycle management (Initialize/Deinitialize)
Channel configuration and management
Symbol transmission and reception
RMT-specific features (carrier modulation, loopback, encoder configuration)
WS2812 LED protocol timing validation with comprehensive color testing (GPIO8) • Primary colors (R/G/B) at maximum brightness for timing stress testing • Secondary colors (Yellow/Magenta/Cyan) and white variations • Brightness sweep tests (0-255) for each color channel • Bit pattern validation (alternating, edge cases, specific patterns) • Rainbow color wheel transitions with HSV to RGB conversion • Rapid color change sequences for protocol stress testing
Automated loopback testing (GPIO8 TX -> GPIO18 RX)
Logic analyzer test scenarios
Advanced RMT features (DMA, memory blocks, queue depth)
Status and diagnostics (statistics, error reporting)
Channel-specific callbacks (transmit, receive, error)
Edge cases and stress testing
ASCII Art test result decoration

Note: This test suite is designed for ESP32-C6 DevKitM-1 with ESP-IDF v5.5+ RMT driver; Uses built-in RGB LED on GPIO8 for WS2812 testing and automated loopback; Automated testing: Connect GPIO8 (TX) to GPIO18 (RX) with jumper wire; Incorporates latest PIO improvements: channel-specific callbacks, resolution_hz, variant validation

Function Documentation

◆ app_main()

void app_main ( void )

◆ create_logic_analyzer_test_pattern()

void create_logic_analyzer_test_pattern	(	hf_pio_symbol_t *	symbols,
		size_t &	symbol_count,
		uint32_t	resolution_ns )

noexcept

Create test pattern for logic analyzer verification using resolution_ns timing.

◆ create_test_channel_config()

hf_pio_channel_config_t create_test_channel_config	(	hf_gpio_num_t	gpio_pin,
		hf_pio_direction_t	direction = hf_pio_direction_t::Transmit )

noexcept

Create a default PIO channel configuration for testing using resolution_ns ESP32-C6 specific configuration for RMT compatibility with latest improvements.

◆ create_ws2812_reset_symbol()

hf_pio_symbol_t create_ws2812_reset_symbol ( uint32_t resolution_ns )

noexcept

Create WS2812 reset symbol using resolution_ns timing.

◆ create_ws2812_rgb_symbols()

void create_ws2812_rgb_symbols	(	uint8_t	r,
		uint8_t	g,
		uint8_t	b,
		hf_pio_symbol_t *	symbols,
		uint32_t	resolution_ns )

noexcept

Create WS2812 symbols for RGB data using resolution_ns timing.

Parameters

r	Red component (0-255)
g	Green component (0-255)
b	Blue component (0-255)
symbols	Output array (must have space for 48 symbols - 24 bits * 2 symbols per bit)
resolution_ns	The resolution in nanoseconds for timing calculations

◆ ensure_minimum_tick_duration()

void ensure_minimum_tick_duration	(	hf_pio_symbol_t *	symbols,
		size_t	symbol_count,
		uint32_t	min_ticks = 1 )

noexcept

Ensure minimum tick duration for symbols to prevent "Duration too short" errors.

Parameters

symbols	Array of symbols to validate
symbol_count	Number of symbols in the array
min_ticks	Minimum number of ticks required (default: 1)

◆ test_basic_symbol_transmission()

bool test_basic_symbol_transmission ( )

noexcept

◆ test_callback_functionality()

bool test_callback_functionality ( )

noexcept

◆ test_channel_allocation_helpers()

bool test_channel_allocation_helpers ( )

noexcept

◆ test_channel_configuration()

bool test_channel_configuration ( )

noexcept

◆ test_channel_direction_validation()

bool test_channel_direction_validation ( )

noexcept

◆ test_constructor_default()

bool test_constructor_default ( )

noexcept

◆ test_destructor_cleanup()

bool test_destructor_cleanup ( )

noexcept

◆ test_esp32_variant_detection()

bool test_esp32_variant_detection ( )

noexcept

◆ test_frequency_sweep()

bool test_frequency_sweep ( )

noexcept

◆ test_hardware_loopback_gpio8_to_gpio18()

bool test_hardware_loopback_gpio8_to_gpio18 ( )

noexcept

◆ test_initialization_states()

bool test_initialization_states ( )

noexcept

◆ test_lazy_initialization()

bool test_lazy_initialization ( )

noexcept

◆ test_logic_analyzer_patterns()

bool test_logic_analyzer_patterns ( )

noexcept

◆ test_loopback_functionality()

bool test_loopback_functionality ( )

noexcept

◆ test_multiple_channel_configuration()

bool test_multiple_channel_configuration ( )

noexcept

◆ test_pio_system_validation()

bool test_pio_system_validation ( )

noexcept

◆ test_resolution_ns_usage()

bool test_resolution_ns_usage ( )

noexcept

◆ test_rmt_advanced_configuration()

bool test_rmt_advanced_configuration ( )

noexcept

◆ test_rmt_carrier_modulation()

bool test_rmt_carrier_modulation ( )

noexcept

◆ test_rmt_encoder_configuration()

bool test_rmt_encoder_configuration ( )

noexcept

◆ test_statistics_and_diagnostics()

bool test_statistics_and_diagnostics ( )

noexcept

◆ test_stress_transmission()

bool test_stress_transmission ( )

noexcept

◆ test_transmission_edge_cases()

bool test_transmission_edge_cases ( )

noexcept

◆ test_ws2812_brightness_sweep()

bool test_ws2812_brightness_sweep ( )

noexcept

◆ test_ws2812_color_cycle()

bool test_ws2812_color_cycle ( )

noexcept

◆ test_ws2812_multiple_leds()

bool test_ws2812_multiple_leds ( )

noexcept

◆ test_ws2812_pattern_validation()

bool test_ws2812_pattern_validation ( )

noexcept

◆ test_ws2812_rainbow_transition()

bool test_ws2812_rainbow_transition ( )

noexcept

◆ test_ws2812_single_led()

bool test_ws2812_single_led ( )

noexcept

◆ TestErrorCallback()

void TestErrorCallback	(	hf_u8_t	channel_id,
		hf_pio_err_t	error,
		void *	user_data )

◆ TestReceiveCallback()

void TestReceiveCallback	(	hf_u8_t	channel_id,
		const hf_pio_symbol_t *	symbols,
		size_t	symbol_count,
		void *	user_data )

◆ TestTransmitCallback()

void TestTransmitCallback	(	hf_u8_t	channel_id,
		size_t	symbols_sent,
		void *	user_data )

Variable Documentation

◆ ENABLE_ADVANCED_TESTS

constexpr bool ENABLE_ADVANCED_TESTS = true

staticconstexpr

◆ ENABLE_ANALYZER_TESTS

constexpr bool ENABLE_ANALYZER_TESTS = true

staticconstexpr

◆ ENABLE_CALLBACK_TESTS

constexpr bool ENABLE_CALLBACK_TESTS = true

staticconstexpr

◆ ENABLE_CHANNEL_TESTS

constexpr bool ENABLE_CHANNEL_TESTS = true

staticconstexpr

◆ ENABLE_CORE_TESTS

constexpr bool ENABLE_CORE_TESTS = true

staticconstexpr

◆ ENABLE_DIAGNOSTIC_TESTS

constexpr bool ENABLE_DIAGNOSTIC_TESTS = true

staticconstexpr

◆ ENABLE_LOOPBACK_TESTS

constexpr bool ENABLE_LOOPBACK_TESTS = true

staticconstexpr

◆ ENABLE_STRESS_TESTS

constexpr bool ENABLE_STRESS_TESTS = true

staticconstexpr

◆ ENABLE_TRANSMISSION_TESTS

constexpr bool ENABLE_TRANSMISSION_TESTS = true

staticconstexpr

◆ ENABLE_VARIANT_TESTS

constexpr bool ENABLE_VARIANT_TESTS = true

staticconstexpr

◆ ENABLE_WS2812_TESTS

constexpr bool ENABLE_WS2812_TESTS = true

staticconstexpr

◆ g_callback_data

CallbackTestData g_callback_data[HF_RMT_MAX_CHANNELS] = {}

static

◆ g_test_results

TestResults g_test_results

static

◆ TAG

const char* TAG = "PIO_Test"

static

◆ TEST_GPIO_RX

constexpr hf_gpio_num_t TEST_GPIO_RX = 18

staticconstexpr

◆ TEST_GPIO_TX

constexpr hf_gpio_num_t TEST_GPIO_TX = 8

staticconstexpr

◆ TEST_RESOLUTION_LOW_NS

constexpr uint32_t TEST_RESOLUTION_LOW_NS = 10000

staticconstexpr

◆ TEST_RESOLUTION_STANDARD_NS

constexpr uint32_t TEST_RESOLUTION_STANDARD_NS = 500

staticconstexpr

◆ TEST_RESOLUTION_WS2812_NS

constexpr uint32_t TEST_RESOLUTION_WS2812_NS = 125

staticconstexpr

◆ WS2812_RESET

constexpr uint32_t WS2812_RESET = 50000

staticconstexpr

◆ WS2812_T0H

constexpr uint32_t WS2812_T0H = 350

staticconstexpr

◆ WS2812_T0L

constexpr uint32_t WS2812_T0L = 900

staticconstexpr

◆ WS2812_T1H

constexpr uint32_t WS2812_T1H = 700

staticconstexpr

◆ WS2812_T1L

constexpr uint32_t WS2812_T1L = 600

staticconstexpr

Classes

Functions

Variables

Detailed Description

Function Documentation

◆ app_main()

◆ create_logic_analyzer_test_pattern()

◆ create_test_channel_config()

◆ create_ws2812_reset_symbol()

◆ create_ws2812_rgb_symbols()

◆ ensure_minimum_tick_duration()

◆ test_basic_symbol_transmission()

◆ test_callback_functionality()

◆ test_channel_allocation_helpers()

◆ test_channel_configuration()

◆ test_channel_direction_validation()

◆ test_constructor_default()

◆ test_destructor_cleanup()

◆ test_esp32_variant_detection()

◆ test_frequency_sweep()

◆ test_hardware_loopback_gpio8_to_gpio18()

◆ test_initialization_states()

◆ test_lazy_initialization()

◆ test_logic_analyzer_patterns()

◆ test_loopback_functionality()

◆ test_multiple_channel_configuration()

◆ test_pio_system_validation()

◆ test_resolution_ns_usage()

◆ test_rmt_advanced_configuration()

◆ test_rmt_carrier_modulation()

◆ test_rmt_encoder_configuration()

◆ test_statistics_and_diagnostics()

◆ test_stress_transmission()

◆ test_transmission_edge_cases()

◆ test_ws2812_brightness_sweep()

◆ test_ws2812_color_cycle()

◆ test_ws2812_multiple_leds()

◆ test_ws2812_pattern_validation()

◆ test_ws2812_rainbow_transition()

◆ test_ws2812_single_led()

◆ TestErrorCallback()

◆ TestReceiveCallback()

◆ TestTransmitCallback()

Variable Documentation

◆ ENABLE_ADVANCED_TESTS

◆ ENABLE_ANALYZER_TESTS

◆ ENABLE_CALLBACK_TESTS

◆ ENABLE_CHANNEL_TESTS

◆ ENABLE_CORE_TESTS

◆ ENABLE_DIAGNOSTIC_TESTS

◆ ENABLE_LOOPBACK_TESTS

◆ ENABLE_STRESS_TESTS

◆ ENABLE_TRANSMISSION_TESTS

◆ ENABLE_VARIANT_TESTS

◆ ENABLE_WS2812_TESTS

◆ g_callback_data

◆ g_test_results

◆ TAG

◆ TEST_GPIO_RX

◆ TEST_GPIO_TX

◆ TEST_RESOLUTION_LOW_NS

◆ TEST_RESOLUTION_STANDARD_NS

◆ TEST_RESOLUTION_WS2812_NS

◆ WS2812_RESET

◆ WS2812_T0H

◆ WS2812_T0L

◆ WS2812_T1H

◆ WS2812_T1L