PwmComprehensiveTest.cpp File Reference

Comprehensive PWM testing suite for ESP32 family (noexcept) More...

#include "TestFramework.h"
#include "base/BasePwm.h"
#include "mcu/esp32/EspGpio.h"
#include "mcu/esp32/EspPwm.h"
#include <array>

Include dependency graph for PwmComprehensiveTest.cpp:

Functions
hf_pwm_unit_config_t	create_test_config () noexcept
	Create a default PWM configuration for testing.
hf_pwm_unit_config_t	create_fade_test_config () noexcept
	Create a PWM configuration specifically for fade testing.
hf_pwm_unit_config_t	create_basic_with_fade_config () noexcept
	Create a PWM configuration for basic mode with fade enabled (for channel enable operations)
hf_pwm_channel_config_t	create_test_channel_config (hf_gpio_num_t gpio_pin, hf_u32_t frequency_hz=HF_PWM_DEFAULT_FREQUENCY, hf_u8_t resolution_bits=HF_PWM_DEFAULT_RESOLUTION) noexcept
	Create a default channel configuration for testing with explicit resolution control.
hf_pwm_channel_config_t	create_test_channel_config_with_duty (hf_gpio_num_t gpio_pin, float duty_percentage, hf_u32_t frequency_hz=HF_PWM_DEFAULT_FREQUENCY, hf_u8_t resolution_bits=HF_PWM_DEFAULT_RESOLUTION) noexcept
	Create channel configuration with specific duty cycle percentage.
bool	test_constructor_default () noexcept
	Test PWM constructor variations and object creation.
bool	test_destructor_cleanup () noexcept
bool	test_initialization_states () noexcept
	Test PWM initialization state management and lifecycle.
bool	test_lazy_initialization () noexcept
bool	test_mode_configuration () noexcept
bool	test_clock_source_configuration () noexcept
bool	test_channel_configuration () noexcept
bool	test_channel_enable_disable () noexcept
bool	test_duty_cycle_control () noexcept
	Test comprehensive duty cycle control functionality.
bool	test_frequency_control () noexcept
bool	test_phase_shift_control () noexcept
bool	test_synchronized_operations () noexcept
bool	test_complementary_outputs () noexcept
bool	test_hardware_fade () noexcept
bool	test_idle_level_control () noexcept
bool	test_timer_management () noexcept
	Test comprehensive LEDC timer resource management.
bool	test_status_reporting () noexcept
bool	test_statistics_and_diagnostics () noexcept
void	test_fade_callback_ch0 (hf_channel_id_t channel_id)
void	test_fade_callback_ch1 (hf_channel_id_t channel_id)
bool	test_callbacks () noexcept
bool	test_basic_mode_without_fade () noexcept
	Test basic mode without fade functionality.
bool	test_fade_mode_functionality () noexcept
	Test fade mode functionality.
bool	test_resolution_specific_duty_cycles () noexcept
	Test resolution-specific duty cycle accuracy (NEW CRITICAL TEST)
bool	test_frequency_resolution_validation () noexcept
	Test frequency/resolution validation (NEW CRITICAL TEST)
bool	test_enhanced_validation_system () noexcept
	Test enhanced validation system with clock source awareness (NEW)
bool	test_percentage_consistency_across_resolutions () noexcept
	Test percentage consistency across different resolutions (NEW)
bool	test_resolution_control_methods () noexcept
	Test direct resolution control methods (NEW)
bool	test_resolution_aware_duty_calculations () noexcept
	Test resolution-aware duty cycle calculations (NEW)
bool	test_edge_cases () noexcept
bool	test_stress_scenarios () noexcept
bool	test_timer_health_check_and_recovery () noexcept
	Test timer health check and recovery mechanisms (NEW)
bool	test_safe_eviction_policies () noexcept
	Test safe eviction policies (NEW CRITICAL SAFETY TEST)
void	app_main (void)

Variables
static const char *	TAG = "PWM_Test"
static TestResults	g_test_results
static constexpr bool	ENABLE_CORE_TESTS = true
static constexpr bool	ENABLE_CONFIGURATION_TESTS
static constexpr bool	ENABLE_CHANNEL_TESTS = true
static constexpr bool	ENABLE_CONTROL_TESTS = true
static constexpr bool	ENABLE_ADVANCED_TESTS
static constexpr bool	ENABLE_ESP_SPECIFIC_TESTS
static constexpr bool	ENABLE_RESOLUTION_TESTS = true
static constexpr bool	ENABLE_DIAGNOSTIC_TESTS = true
static constexpr bool	ENABLE_STRESS_TESTS = true
static volatile bool	g_fade_callback_called [HF_PWM_MAX_CHANNELS] = {false}
static volatile hf_channel_id_t	g_last_fade_channel = 0xFF

Detailed Description

Comprehensive PWM testing suite for ESP32 family (noexcept)

This comprehensive test suite validates all functionality of the EspPwm class across different ESP32 variants, with particular focus on LEDC peripheral capabilities and constraints:

Test Coverage:

• Lifecycle Management: Constructor/Destructor, Initialize/Deinitialize
• Configuration: Modes, clock sources, unit configuration
• Channel Management: Configure, enable/disable, validation
• PWM Control: Duty cycle, frequency, resolution control
• Advanced Features: Synchronized operations, complementary outputs
• ESP32-Specific: Hardware fade, idle levels, timer management
• LEDC Validation: Clock source constraints, frequency/resolution limits
• Resource Management: Timer allocation, eviction policies, health checks
• Status & Diagnostics: Statistics, error reporting, capability detection
• Callbacks: Fade callback mechanisms (ESP-IDF LEDC native support only)
• Edge Cases & Stress: Boundary conditions, resource exhaustion, recovery

Hardware Requirements:

• ESP32 development board (any variant: ESP32, ESP32-S2/S3, ESP32-C3/C6, ESP32-H2)
• GPIO pins for PWM output testing (configurable)
• Optional: Logic analyzer or oscilloscope for signal verification

Test Progression Indicator:

GPIO14 toggles HIGH/LOW after each test completion for visual feedback. This allows monitoring test progress without serial output.

Note

This test suite is designed to be variant-agnostic and will adapt to the specific LEDC capabilities of the target ESP32 variant.

Function Documentation

app_main()

void app_main

(

void

)

create_basic_with_fade_config()

hf_pwm_unit_config_t create_basic_with_fade_config ( )

noexcept

Create a PWM configuration for basic mode with fade enabled (for channel enable operations)

create_fade_test_config()

hf_pwm_unit_config_t create_fade_test_config ( )

noexcept

Create a PWM configuration specifically for fade testing.

create_test_channel_config()

hf_pwm_channel_config_t create_test_channel_config ( hf_gpio_num_t gpio_pin, hf_u32_t frequency_hz = HF_PWM_DEFAULT_FREQUENCY, hf_u8_t resolution_bits = HF_PWM_DEFAULT_RESOLUTION )

noexcept

Create a default channel configuration for testing with explicit resolution control.

Parameters

gpio_pin	GPIO pin number for PWM output
frequency_hz	PWM frequency in Hz (default: 1kHz)
resolution_bits	PWM resolution in bits (default: 10-bit)

Returns

Configured PWM channel configuration for testing

Creates a standard channel configuration with:

• 50% initial duty cycle
• APB clock source preference
• Basic PWM mode
• No output inversion
• Low priority (non-critical)

create_test_channel_config_with_duty()

hf_pwm_channel_config_t create_test_channel_config_with_duty ( hf_gpio_num_t gpio_pin, float duty_percentage, hf_u32_t frequency_hz = HF_PWM_DEFAULT_FREQUENCY, hf_u8_t resolution_bits = HF_PWM_DEFAULT_RESOLUTION )

noexcept

Create channel configuration with specific duty cycle percentage.

create_test_config()

hf_pwm_unit_config_t create_test_config ( )

noexcept

Create a default PWM configuration for testing.

Returns

Configured PWM unit configuration for basic testing

Creates a standard test configuration with:

• Basic PWM mode (no fade)
• APB clock source (80MHz)
• Interrupts enabled
• Fade functionality disabled for basic testing

test_basic_mode_without_fade()

bool test_basic_mode_without_fade ( )

noexcept

Test basic mode without fade functionality.

test_callbacks()

bool test_callbacks ( )

noexcept

test_channel_configuration()

bool test_channel_configuration ( )

noexcept

test_channel_enable_disable()

bool test_channel_enable_disable ( )

noexcept

test_clock_source_configuration()

bool test_clock_source_configuration ( )

noexcept

test_complementary_outputs()

bool test_complementary_outputs ( )

noexcept

test_constructor_default()

bool test_constructor_default ( )

noexcept

Test PWM constructor variations and object creation.

Returns

true if all constructor tests pass, false otherwise

Validates proper object construction without hardware initialization:

• Default constructor with minimal configuration
• Constructor with explicit unit configuration

Note

No hardware initialization occurs during construction (lazy initialization pattern)

Warning

All constructors must complete without exceptions (noexcept specification)

test_destructor_cleanup()

bool test_destructor_cleanup ( )

noexcept

test_duty_cycle_control()

bool test_duty_cycle_control ( )

noexcept

Test comprehensive duty cycle control functionality.

Returns

true if all duty cycle tests pass, false otherwise

Validates precise duty cycle control across full range:

• Float Interface: Tests 0%, 25%, 50%, 75%, 100% duty cycles
• Raw Interface: Tests raw values 0, 256, 512, 768, 1023 (10-bit)
• Input Validation: Tests rejection of invalid values (-0.1, 1.1)
• Accuracy Verification: Confirms readback values match set values

Note

Uses GPIO 2 for PWM output with 1kHz frequency @ 10-bit resolution

Warning

Duty cycle accuracy should be within ±1% of commanded value

See also

test_resolution_specific_duty_cycles() for resolution-specific testing

test_edge_cases()

bool test_edge_cases ( )

noexcept

test_enhanced_validation_system()

bool test_enhanced_validation_system ( )

noexcept

Test enhanced validation system with clock source awareness (NEW)

Returns

true if all validation system tests pass, false otherwise

Comprehensive validation of the LEDC peripheral constraint system:

Phase 1: Clock Source Validation

• Tests APB clock (80MHz) with various frequency/resolution combinations
• Validates hardware constraint formula: freq × (2^resolution) ≤ clock_freq
• Verifies proper error reporting for invalid combinations

Phase 2: Dynamic Resolution Calculation

• Tests maximum achievable resolution for given frequencies
• Validates theoretical vs. practical resolution limits
• Confirms hardware constraint calculations

Phase 3: Enhanced Duty Cycle Validation

• Tests overflow protection for different resolutions
• Validates automatic clamping of out-of-range values
• Confirms resolution-specific duty cycle ranges

Phase 4: Auto-Fallback Functionality

• Tests automatic resolution adjustment for problematic combinations
• Validates fallback resolution selection algorithms
• Confirms graceful handling of impossible combinations

Note

This test validates the core LEDC peripheral constraint system

Warning

Tests may fail on ESP32 variants with different LEDC capabilities

See also

test_frequency_resolution_validation() for basic constraint testing

SetFrequencyWithAutoFallback() for automatic resolution adjustment

test_fade_callback_ch0()

void test_fade_callback_ch0

(

hf_channel_id_t

channel_id

)

test_fade_callback_ch1()

void test_fade_callback_ch1

(

hf_channel_id_t

channel_id

)

test_fade_mode_functionality()

bool test_fade_mode_functionality ( )

noexcept

Test fade mode functionality.

test_frequency_control()

bool test_frequency_control ( )

noexcept

test_frequency_resolution_validation()

bool test_frequency_resolution_validation ( )

noexcept

Test frequency/resolution validation (NEW CRITICAL TEST)

test_hardware_fade()

bool test_hardware_fade ( )

noexcept

test_idle_level_control()

bool test_idle_level_control ( )

noexcept

test_initialization_states()

bool test_initialization_states ( )

noexcept

Test PWM initialization state management and lifecycle.

Returns

true if all initialization state tests pass, false otherwise

Validates proper initialization state transitions:

• Initial uninitialized state after construction
• Manual initialization with Initialize() method
• Double initialization protection (returns ALREADY_INITIALIZED)
• Proper deinitialization with Deinitialize() method
• State consistency throughout lifecycle

Note

Tests the explicit initialization path (not lazy initialization)

Warning

All state transitions must be atomic and thread-safe

test_lazy_initialization()

bool test_lazy_initialization ( )

noexcept

test_mode_configuration()

bool test_mode_configuration ( )

noexcept

test_percentage_consistency_across_resolutions()

bool test_percentage_consistency_across_resolutions ( )

noexcept

Test percentage consistency across different resolutions (NEW)

test_phase_shift_control()

bool test_phase_shift_control ( )

noexcept

test_resolution_aware_duty_calculations()

bool test_resolution_aware_duty_calculations ( )

noexcept

Test resolution-aware duty cycle calculations (NEW)

test_resolution_control_methods()

bool test_resolution_control_methods ( )

noexcept

Test direct resolution control methods (NEW)

test_resolution_specific_duty_cycles()

bool test_resolution_specific_duty_cycles ( )

noexcept

Test resolution-specific duty cycle accuracy (NEW CRITICAL TEST)

test_safe_eviction_policies()

bool test_safe_eviction_policies ( )

noexcept

Test safe eviction policies (NEW CRITICAL SAFETY TEST)

test_statistics_and_diagnostics()

bool test_statistics_and_diagnostics ( )

noexcept

test_status_reporting()

bool test_status_reporting ( )

noexcept

test_stress_scenarios()

bool test_stress_scenarios ( )

noexcept

test_synchronized_operations()

bool test_synchronized_operations ( )

noexcept

test_timer_health_check_and_recovery()

bool test_timer_health_check_and_recovery ( )

noexcept

Test timer health check and recovery mechanisms (NEW)

test_timer_management()

bool test_timer_management ( )

noexcept

Test comprehensive LEDC timer resource management.

Returns

true if all timer management tests pass, false otherwise

Validates advanced timer allocation and management features:

Phase 1: Basic Timer Allocation

• Tests automatic timer assignment for different frequency/resolution combinations
• Validates timer sharing optimization for compatible frequencies
• Confirms proper timer resource tracking

Phase 2: Timer Exhaustion Scenarios

• Tests behavior when all timers are allocated with incompatible combinations
• Validates proper error reporting (TIMER_CONFLICT)
• Confirms system stability under resource pressure

Phase 3: Compatible Frequency Reuse

• Tests timer sharing for frequencies within tolerance (±5%)
• Validates resource optimization and efficiency

Phase 4: Timer Recovery

• Tests timer resource recovery after channel release
• Validates automatic cleanup and reallocation

Phase 5: Forced Timer Assignment

• Tests manual timer assignment with ForceTimerAssignment()
• Validates override of automatic allocation

Phase 6: Diagnostics Validation

• Tests statistics and diagnostics reporting accuracy
• Validates resource usage tracking

Note

This test exercises the core LEDC timer management algorithms

Warning

Timer allocation behavior may vary between ESP32 variants

See also

FindOrAllocateTimer() for Timer Module allocation implementation

ForceTimerAssignment() for manual Timer Module control

Variable Documentation

ENABLE_ADVANCED_TESTS

constexpr bool ENABLE_ADVANCED_TESTS

staticconstexpr

Initial value:

=
    true

ENABLE_CHANNEL_TESTS

constexpr bool ENABLE_CHANNEL_TESTS = true

staticconstexpr

ENABLE_CONFIGURATION_TESTS

constexpr bool ENABLE_CONFIGURATION_TESTS

staticconstexpr

Initial value:

=
    true

ENABLE_CONTROL_TESTS

constexpr bool ENABLE_CONTROL_TESTS = true

staticconstexpr

ENABLE_CORE_TESTS

constexpr bool ENABLE_CORE_TESTS = true

staticconstexpr

ENABLE_DIAGNOSTIC_TESTS

constexpr bool ENABLE_DIAGNOSTIC_TESTS = true

staticconstexpr

ENABLE_ESP_SPECIFIC_TESTS

constexpr bool ENABLE_ESP_SPECIFIC_TESTS

staticconstexpr

Initial value:

=
    true

ENABLE_RESOLUTION_TESTS

constexpr bool ENABLE_RESOLUTION_TESTS = true

staticconstexpr

ENABLE_STRESS_TESTS

constexpr bool ENABLE_STRESS_TESTS = true

staticconstexpr

g_fade_callback_called

volatile bool g_fade_callback_called[HF_PWM_MAX_CHANNELS] = {false}

static

g_last_fade_channel

volatile hf_channel_id_t g_last_fade_channel = 0xFF

static

g_test_results

TestResults g_test_results

static

TAG

const char* TAG = "PWM_Test"

static