TLE92466ED ESP32 Examples Documentation

📚 Documentation Index

Complete documentation for TLE92466ED driver examples on ESP32-C6.

🎯 Quick Start

Document Purpose When to Read
Driver Integration Test Driver API validation Start here for driver testing
Solenoid Control Test Real hardware solenoid testing For actual solenoid operation
Configuration Guide All configuration options Before customizing
Test Framework Reference Framework API details Writing custom tests

📖 Documentation Structure

1. Driver Integration Test Suite

Guide to the driver integration test suite

Contents

  • ✅ Test Framework Architecture - How the test infrastructure works
  • ✅ Test Suite Structure - All 13 test sections with 40+ tests
  • ✅ Hardware Setup - Complete wiring diagrams and pin configurations
  • ✅ Configuration - Hardware and test settings
  • ✅ Building and Running - Build commands and workflows
  • ✅ Expected Output - Full example outputs with explanations
  • ✅ Test Coverage - Complete API coverage breakdown
  • ✅ Individual Test Details - Deep dive into each test
  • ✅ Telemetry Testing - Telemetry validation
  • ✅ Troubleshooting - Common issues and solutions
  • ✅ Performance Characteristics - Timing and memory usage

Start here for driver API validation (no hardware required)!

2. Solenoid Control Test

Complete guide to real hardware solenoid testing

Contents

  • ✅ Hardware Requirements - Complete component list and specifications
  • ✅ System Architecture - Block diagrams and control flow
  • ✅ Hardware Setup - Detailed wiring diagrams and connections
  • ✅ ADC Configuration - Analog input setup and calibration
  • ✅ Solenoid Configuration - Single channel and parallel pair setup
  • ✅ Control Algorithm - Current calculation and regulation
  • ✅ Real-Time Telemetry - Monitoring and display
  • ✅ Operation - Startup sequence and control loop
  • ✅ Troubleshooting - Hardware-specific issues and solutions
  • ✅ Safety Considerations - Electrical and operational safety

Use this for real hardware testing with actual solenoids!

3. Configuration Guide

Complete reference for all configuration files and options

Contents

  • ✅ Hardware Configuration (TLE92466ED_TestConfig.hpp) - SPI pins, frequencies, current limits
  • ✅ Application Configuration (app_config.yml) - Build metadata and app definitions
  • ✅ Test Section Configuration - Compile-time test enable/disable
  • ✅ ESP-IDF SDK Configuration (sdkconfig) - Framework settings
  • ✅ Component Configuration - ESP-IDF component setup
  • ✅ Configuration Workflows - Development and production setups
  • ✅ Troubleshooting - Configuration-related issues

Read this when you need to customize hardware or build settings.

4. Test Framework Reference

Detailed API reference for the TLE92466ED Test Framework

Contents

  • ✅ GPIO14 Progress Indicator - Visual feedback system
  • ✅ Test Result Tracking - Automatic pass/fail counting
  • ✅ Test Execution Macros - RUN_TEST, RUN_TEST_IN_TASK, sections
  • ✅ Usage Guide - How to write test functions
  • ✅ Advanced Usage - Custom contexts, stack sizes, timeouts
  • ✅ Best Practices - Test organization
  • ✅ Performance Impact - Memory and timing overhead
  • ✅ CI/CD Integration - Automated testing

Essential reading for creating custom tests or understanding the framework.

🚀 Getting Started

Prerequisites

  • Hardware:
    • ESP32-C6-DevKitC-1 development board
    • TLE92466ED evaluation board or custom PCB
    • 12-24V power supply (2A minimum)
    • Test load (solenoid, resistor, or LED)
    • USB-C cable for programming
  • Software:
    • ESP-IDF v5.3 or later (v5.5 recommended)
    • Python 3.8+
    • Git with submodules support
    • Serial terminal (screen, minicom, or built-in monitor)

Quick Start Steps

  1. Clone and setup: 
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    git clone https://github.com/N3b3x/hf-tle92466ed-driver.git
cd hf-tle92466ed-driver/examples/esp32
git submodule update --init --recursive
  2. Configure ESP-IDF: 
    1
2

    . $IDF_PATH/export.sh
idf.py set-target esp32c6
  3. Build driver integration test: 
    1

    ./scripts/build_app.sh driver_integration_test Debug
  4. Flash and monitor: 
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    ./scripts/flash_app.sh driver_integration_test Debug
./scripts/monitor_app.sh driver_integration_test
  5. See results:
    • Serial output shows test execution
    • GPIO14 toggles with test progress
    • Summary printed at end

📊 Example Overview

Driver Integration Test

Purpose: Driver API validation without hardware requirements

Test Sections (13 total):

  1. INITIALIZATION_TESTS - HAL setup, driver init, chip ID verification
  2. MODE_CONTROL_TESTS - Mode transitions and state management
  3. GLOBAL_CONFIGURATION_TESTS - Global device configuration
  4. CHANNEL_CONTROL_TESTS - Channel enable/disable and mode configuration
  5. CURRENT_CONTROL_TESTS - Current setpoint control and ramping
  6. PWM_CONFIGURATION_TESTS - PWM period configuration
  7. DITHER_CONFIGURATION_TESTS - Dither configuration
  8. DIAGNOSTICS_TESTS - Telemetry and diagnostics
  9. FAULT_MANAGEMENT_TESTS - Fault handling
  10. WATCHDOG_TESTS - Watchdog functionality
  11. GPIO_CONTROL_TESTS - GPIO pin control
  12. MULTI_CHANNEL_TESTS - All channels individually tested
  13. PARALLEL_OPERATION_TESTS - Parallel pair configuration
  14. ERROR_CONDITION_TESTS - Error handling validation

Features:

  • ✅ 40+ individual tests
  • ✅ Complete API coverage
  • ✅ FreeRTOS task-based test execution
  • ✅ GPIO14 progress indicator
  • ✅ Automatic result tracking
  • ✅ Telemetry testing
  • ✅ Formatted output
  • ✅ No actual solenoids required

Read: Driver Integration Test

Solenoid Control Test

Purpose: Real hardware solenoid testing with ADC-based current control

Features:

  • ✅ Two solenoids: single channel and parallel pair
  • ✅ ADC-based control (0-3.3V → 0-100% current)
  • ✅ Independent current ranges per solenoid
  • ✅ Real-time telemetry (every 1 second)
  • ✅ Continuous operation
  • ✅ Fault monitoring

Hardware Required: TLE92466ED IC + Two Solenoids + Power Supplies

Read: Solenoid Control Test

🔧 Configuration Overview

Hardware Configuration

File: main/TLE92466ED_TestConfig.hpp

What’s configured:

  • SPI GPIO pins (MISO, MOSI, SCLK, CS)
  • SPI frequency and mode
  • Current limits (single and parallel)
  • Hardware specifications (voltage, temperature)
  • Test parameters

Example: cpp struct SPIPins { static constexpr int MISO = 2; // GPIO2 static constexpr int MOSI = 7; // GPIO7 static constexpr int SCLK = 6; // GPIO6 static constexpr int CS = 10; // GPIO10 }; text

Read: Configuration Guide - Hardware Configuration

Build Configuration

File: app_config.yml

What’s configured:

  • Available applications (basic_usage, multi_channel, etc.)
  • Build types (Debug, Release)
  • ESP-IDF version compatibility
  • CI/CD settings
  • Documentation links

Example: yaml apps: basic_usage: description: "Basic usage example for TLE92466ED" source_file: "BasicUsageExample.cpp" build_types: ["Debug", "Release"] text

Read: Configuration Guide - Application Configuration

Test Configuration

File: Each example source file (e.g., BasicUsageExample.cpp)

What’s configured:

  • Test section enable/disable flags
  • Compile-time test selection

Example: cpp #define ENABLE_INITIALIZATION_TESTS 1 // Enable #define ENABLE_BASIC_OPERATION_TESTS 1 // Enable #define ENABLE_CURRENT_CONTROL_TESTS 0 // Disable text

Read: Configuration Guide - Test Section Configuration

🧪 Test Framework Features

The examples use a test framework with:

✅ FreeRTOS Task-Based Execution

  • Each test runs in isolated task
  • Custom stack size per test (default: 8KB)
  • Automatic semaphore synchronization
  • 30-second timeout protection

✅ GPIO14 Progress Indicator

  • Visual feedback on oscilloscope/logic analyzer
  • Toggle: HIGH/LOW on test completion
  • Blink patterns: 5 blinks at section boundaries
  • Hardware-level progress tracking

✅ Automatic Result Tracking

  • Pass/fail counting
  • Microsecond-precision execution timing
  • Success rate calculation
  • Formatted summaries

✅ Test Section Management

  • Compile-time section enable/disable
  • Organized test grouping
  • Custom blink patterns per section

Read: Test Framework Reference

📈 Example Output

Test Execution

```text ╔══════════════════════════════════════════════════════════════════╗ ║ TLE92466ED BASIC USAGE TEST SUITE - ESP32-C6 ║ ╚══════════════════════════════════════════════════════════════════╝ Target: esp32c6 ESP-IDF Version: v5.5.0

╔══════════════════════════════════════════════════════════════════╗ ║ SECTION: INITIALIZATION TESTS ║ ╚══════════════════════════════════════════════════════════════════╝ [GPIO14: Blink pattern - 5 blinks]

╔══════════════════════════════════════════════════════════════════╗ ║ Running (task): hal_initialization ║ ╚══════════════════════════════════════════════════════════════════╝ I (1234) TLE92466ED_Basic: Creating HAL instance… I (1235) TLE92466ED_Basic: ✅ HAL initialized successfully [SUCCESS] PASSED (task): hal_initialization (12.34 ms) [GPIO14: Toggle HIGH]

… (more tests) …

╔══════════════════════════════════════════════════════════════════╗ ║ TEST RESULTS SUMMARY ║ ╠══════════════════════════════════════════════════════════════════╣ ║ Total Tests: 7 ║ ║ Passed: 7 ║ ║ Failed: 0 ║ ║ Success Rate: 100.00% ║ ║ Total Time: 234.56 ms ║ ╚══════════════════════════════════════════════════════════════════╝

I (5000) TLE92466ED_Basic: ✅ ALL TESTS PASSED! ```text

🐛 Troubleshooting Quick Reference

Common Issues

Issue Quick Fix Full Guide
All tests fail Check VIO power (3.0-5.5V, typical 3.3V) and wiring Driver Integration Test - Troubleshooting
HAL init fails Verify GPIO pins in TLE92466ED_TestConfig.hpp Configuration - GPIO Conflict
Chip ID read fails Check SPI wiring, CS pin, RESN pin Driver Integration Test - Troubleshooting
Solenoids not working Check VBAT, EN pin, channel enable Solenoid Control Test - Troubleshooting
Stack overflow Increase stack size in RUN_TEST_IN_TASK Configuration - Stack Overflow
Build errors Clean and rebuild: idf.py fullclean && idf.py build Configuration - Build Type Issues

📦 Project Structure

text examples/esp32/ ├── app_config.yml # Build metadata ├── CMakeLists.txt # Main CMake configuration ├── sdkconfig # ESP-IDF SDK configuration │ ├── main/ # Application source │ ├── CMakeLists.txt # Main component build │ ├── TLE92466ED_TestConfig.hpp # Hardware configuration │ ├── TLE92466ED_TestFramework.hpp # Test infrastructure │ ├── ESP32C6_HAL.hpp/.cpp # ESP32-C6 HAL implementation │ ├── DriverIntegrationTest.cpp # Driver integration test suite │ └── SolenoidControlTest.cpp # Real hardware solenoid test │ ├── components/ # ESP-IDF components │ └── hf_tle92466ed/ # TLE92466ED driver component │ ├── CMakeLists.txt │ ├── idf_component.yml │ └── README.md │ ├── docs/ # Documentation │ ├── README.md # This file │ ├── readme_driver_integration_test.md # Driver integration test guide │ ├── readme_solenoid_control_test.md # Solenoid control test guide │ ├── readme_configuration.md # Configuration reference │ └── README_TEST_FRAMEWORK.md # Test framework API │ └── scripts/ # Build/flash scripts (submodule) ├── build_app.sh ├── flash_app.sh └── monitor_app.sh text

🔗 Related Documentation

Driver Documentation

ESP32 Resources

TLE92466ED Resources

🎓 Learning Path

Beginner Path

  1. Read: Driver Integration Test
  2. Build: Driver integration test (Debug mode)
  3. Run: Flash to ESP32-C6 and observe output
  4. Verify: All tests should pass (100% success rate)
  5. Explore: Review telemetry tests and diagnostics

Intermediate Path

  1. Read: Solenoid Control Test
  2. Setup: Connect solenoids and power supplies
  3. Configure: Adjust solenoid current ranges if needed
  4. Test: Run solenoid control test with real hardware
  5. Monitor: Observe real-time telemetry and current regulation

Advanced Path

  1. Read: Test Framework Reference
  2. Extend: Add custom test functions
  3. Port: Implement HAL for different MCU (ESP32-S3, etc.)
  4. Integrate: Set up CI/CD pipeline with test parsing
  5. Optimize: Profile and optimize for your application

💡 Tips and Best Practices

Development Tips

  1. Start with Debug builds for detailed logging
  2. Use GPIO14 indicator to track progress without serial
  3. Monitor SPI signals with logic analyzer during bring-up
  4. Test with known-good load (resistor) before real solenoids
  5. Enable all test sections initially, disable as needed

Configuration Tips

  1. Keep hardware config centralized in TLE92466ED_TestConfig.hpp
  2. Use compile-time flags for test sections (faster than runtime)
  3. Document custom settings in code comments
  4. Version control sdkconfig.defaults for team consistency
  5. Use Release builds for final performance testing

Testing Tips

  1. Run full test suite after any changes
  2. Check GPIO14 patterns on oscilloscope for test flow
  3. Analyze execution times to find performance issues
  4. Test with realistic loads matching your application
  5. Monitor diagnostics for fault conditions

🆘 Getting Help

Documentation Issues

If documentation is unclear or incomplete:

  1. Check the specific guide (Basic Usage, Configuration, Test Framework)
  2. Search for keywords in all docs
  3. Review related driver documentation
  4. Open GitHub issue with details

Build/Configuration Issues

If you have build or configuration problems:

  1. Check Configuration Guide - Troubleshooting
  2. Verify ESP-IDF version (v5.3+)
  3. Clean and rebuild: idf.py fullclean && idf.py build
  4. Check sdkconfig for conflicts

Hardware/Test Issues

If tests fail or hardware doesn’t work:

  1. Driver Integration Test: Check Driver Integration Test - Troubleshooting
  2. Solenoid Control Test: Check Solenoid Control Test - Troubleshooting
  3. Verify wiring against pin configuration
  4. Measure power supplies (VDD: 5V for central logic; VIO: 3.0-5.5V for SPI I/O levels; VBAT: 5.5-41V for solenoids)
  5. Test SPI communication with logic analyzer
  6. Try lower SPI frequency (100kHz) for debugging

Support Channels

  • GitHub Issues: Bug reports, feature requests
  • GitHub Discussions: Questions, general help
  • Driver Documentation: Technical reference

📊 Example Statistics

Driver Integration Test

Metric Value
Total Tests 40+
Test Sections 13
Typical Execution Time 10-15 seconds
Flash Size ~350KB
RAM Usage ~15KB
Stack per Task 8KB

Test Breakdown

Section Tests Time
Initialization 5 ~50-100ms
Mode Control 3 ~30-50ms
Global Configuration 3 ~200-300ms
Channel Control 4 ~500-800ms
Current Control 2 ~2000-3000ms
PWM Configuration 2 ~300-500ms
Dither Configuration 2 ~300-500ms
Diagnostics 7 ~1000-1500ms
Fault Management 2 ~100-200ms
Watchdog 1 ~200-300ms
GPIO Control 1 ~200-300ms
Multi-Channel 1 ~2000-3000ms
Parallel Operation 1 ~300-500ms
Error Conditions 1 ~100-200ms

Solenoid Control Test

Metric Value
Control Update Rate 10 Hz (100ms)
Telemetry Update Rate 1 Hz (1 second)
ADC Sampling Rate 1 kHz
Flash Size ~380KB
RAM Usage ~18KB
Stack 8KB

🎉 Success Criteria

You’ve successfully set up the examples when:

  • ✅ Build completes without errors
  • ✅ Flash and monitor show output
  • ✅ All tests pass (100% success rate)
  • ✅ GPIO14 toggles during execution
  • ✅ Test summary shows timing information
  • ✅ System restarts automatically after tests

Example success output: ```text ╔══════════════════════════════════════════════════════════════════╗ ║ TEST RESULTS SUMMARY ║ ╠══════════════════════════════════════════════════════════════════╣ ║ Total Tests: 7 ║ ║ Passed: 7 ║ ║ Failed: 0 ║ ║ Success Rate: 100.00% ║ ║ Total Time: 234.56 ms ║ ╚══════════════════════════════════════════════════════════════════╝

✅ ALL TESTS PASSED! System will restart in 10 seconds… ```text

Documentation Version: 1.0.0
Last Updated: 2025-10-21
Status: ✅ Complete

Next: Start with Driver Integration Test →