Driver Integration Test Suite - TLE92466ED ESP32-C6

Overview
Purpose
Test Framework Architecture
Test Suite Structure
Hardware Setup
Configuration
Building and Running
Expected Output
Test Coverage
Individual Test Details
Troubleshooting
Performance Characteristics
Related Documentation

Overview

The Driver Integration Test Suite validates all functionality of the TLE92466ED driver without requiring actual solenoids or loads. This test suite provides API validation with 40+ individual tests organized into 13 test sections, covering all driver capabilities.

Key Features

Complete API Coverage: Tests all public driver functions
No Hardware Required: Validates driver logic and SPI communication only
Test Framework: FreeRTOS task-based execution with automatic result tracking
GPIO14 Progress Indicator: Visual feedback on oscilloscope/logic analyzer
Telemetry Testing: Validates all status and diagnostic reading functions
Error Condition Testing: Verifies proper error handling and validation

Purpose

This test suite serves multiple purposes:

Driver Validation: Ensures all driver APIs work correctly
Regression Testing: Detects breaking changes during development
CI/CD Integration: Automated testing in continuous integration pipelines
Documentation: Demonstrates proper usage of all driver functions
Development Aid: Helps developers understand driver capabilities
Quality Assurance: Validates driver behavior before hardware testing

Note: This test validates the driver and SPI communication but does not test actual solenoid operation. For real hardware testing with solenoids, use the Solenoid Control Test.

Test Framework Architecture

The test suite uses the TLE92466ED Test Framework (TLE92466ED_TestFramework.hpp), which provides:

FreeRTOS Task-Based Execution

Each test runs in isolated FreeRTOS task
Custom stack size per test (8KB default)
Automatic semaphore synchronization
30-second timeout protection
Fallback to inline execution on failure

GPIO14 Progress Indicator

Visual feedback on oscilloscope/logic analyzer
Toggle: HIGH/LOW on each test completion
Blink Pattern: 5 blinks at section start/end
Hardware-level test progression tracking

Automatic Result Tracking

Pass/fail counting
Microsecond-precision execution timing
Success rate calculation
Summary reports

Test Section Management

Compile-time section enable/disable
Section-based organization
Custom blink patterns per section
Structured output formatting

Test Suite Structure

This integration test suite validates all functionality of the TLE92466ED driver. The suite includes 13 test sections with 40+ individual tests covering all driver APIs.

Test Sections

1. INITIALIZATION_TESTS (`#define ENABLE_INITIALIZATION_TESTS 1`)

Tests fundamental setup and communication:

test_hal_initialization - ESP32-C6 HAL setup and SPI configuration
test_driver_initialization - TLE92466ED driver instance creation
test_chip_id - SPI communication verification via chip ID
test_ic_version - IC version register reading
test_device_verification - Device ID verification

2. MODE_CONTROL_TESTS (`#define ENABLE_MODE_CONTROL_TESTS 1`)

Tests mode transitions and state management:

test_enter_mission_mode - Transition to Mission Mode
test_enter_config_mode - Transition to Config Mode
test_mode_transitions - Multiple mode transition cycles

3. GLOBAL_CONFIGURATION_TESTS (`#define ENABLE_GLOBAL_CONFIG_TESTS 1`)

Tests global device configuration:

test_crc_control - CRC enable/disable functionality
test_vbat_thresholds - VBAT UV/OV threshold configuration (high-level and raw APIs)
test_global_configuration - Complete global configuration

4. CHANNEL_CONTROL_TESTS (`#define ENABLE_CHANNEL_CONTROL_TESTS 1`)

Tests channel enable/disable and mode configuration:

test_single_channel_control - Single channel enable/disable
test_all_channels_control - All channels enable/disable
test_channel_mask_control - Channel mask-based control
test_channel_mode_configuration - All channel modes (OFF, ICC, Direct Drive, etc.)

5. CURRENT_CONTROL_TESTS (`#define ENABLE_CURRENT_CONTROL_TESTS 1`)

Tests current setpoint control:

test_current_setpoint - Current setting with read-back verification (100mA, 500mA, 1000mA, 1500mA, 2000mA)
test_current_ramping - Smooth 0→1000mA→0mA transitions

6. PWM_CONFIGURATION_TESTS (`#define ENABLE_PWM_CONFIG_TESTS 1`)

Tests PWM period configuration:

test_pwm_period_configuration - High-level API (period in microseconds)
test_pwm_period_raw - Low-level API (mantissa, exponent, low_freq_range)

7. DITHER_CONFIGURATION_TESTS (`#define ENABLE_DITHER_CONFIG_TESTS 1`)

Tests dither configuration:

test_dither_configuration - High-level API (amplitude in mA, frequency in Hz)
test_dither_raw - Low-level API (step_size, num_steps, flat_steps)

8. DIAGNOSTICS_TESTS (`#define ENABLE_DIAGNOSTICS_TESTS 1`)

Tests diagnostics and monitoring:

test_device_status - Global device status reading
test_channel_diagnostics - Channel-specific diagnostics
test_voltage_reading - VBAT and VIO voltage reading
test_current_reading - Average current and duty cycle reading
test_all_channels_telemetry - Telemetry for all 6 channels
test_device_telemetry - Device telemetry
test_telemetry_with_active_channel - Telemetry with active channel

9. FAULT_MANAGEMENT_TESTS (`#define ENABLE_FAULT_MANAGEMENT_TESTS 1`)

Tests fault handling:

test_fault_clearing - Fault flag clearing
test_software_reset - Software reset functionality

10. WATCHDOG_TESTS (`#define ENABLE_WATCHDOG_TESTS 1`)

Tests watchdog functionality:

test_spi_watchdog - SPI watchdog reload with various values

11. GPIO_CONTROL_TESTS (`#define ENABLE_GPIO_CONTROL_TESTS 1`)

Tests GPIO pin control:

test_gpio_control - Reset, Enable, and Fault pin control

12. MULTI_CHANNEL_TESTS (`#define ENABLE_MULTI_CHANNEL_TESTS 1`)

Tests all channels individually:

test_all_channels_individually - All 6 channels tested with enable/disable and current control

13. PARALLEL_OPERATION_TESTS (`#define ENABLE_PARALLEL_OPERATION_TESTS 1`)

Tests parallel channel operation:

test_parallel_operation - Parallel pair configuration (CH0/CH3, CH1/CH2, CH4/CH5)

14. ERROR_CONDITION_TESTS (`#define ENABLE_ERROR_CONDITION_TESTS 1`)

Tests error handling and validation:

test_error_conditions - Wrong mode operations (should fail correctly)

Test Function Signatures

All test functions follow this pattern:

static bool test_function_name() noexcept;

Key Characteristics:

Return bool (true = passed, false = failed)
Declared noexcept for embedded safety
Self-contained and isolated
Descriptive ESP_LOG output
Proper error handling with std::expected

Hardware Setup

Required Components

ESP32-C6-DevKitC-1 development board
TLE92466ED evaluation board or custom PCB
5.5-41V power supply for VBAT (2A minimum) - Note: VBAT not required for SPI communication, but recommended for complete testing. Typical: 12V or 24V automotive
3.0-5.5V power supply for VIO (I/O level supply) - Required for SPI communication (sets I/O voltage levels). Typical: 3.3V or 5.0V
5V power supply for VDD (internal logic supply) - Required for IC operation
Oscilloscope/Logic Analyzer (optional, for GPIO14 monitoring)
Connecting wires

Wiring Diagram

┌─────────────────┐         ┌──────────────────┐
│   ESP32-C6      │         │   TLE92466ED     │
│                 │         │                  │
│  GPIO2  ───────┼────────>│  MISO            │
│  GPIO7  ───────┼────────>│  MOSI            │
│  GPIO6  ───────┼────────>│  SCLK            │
│  GPIO18 ───────┼────────>│  CS              │
│  GPIO21 ───────┼────────>│  RESN            │
│  GPIO20 ───────┼────────>│  EN              │
│  GPIO19 <──────┼─────────│  FAULTN          │
│  GPIO14 ───────┼────────>│  [LED/Scope]    │
│                 │         │                  │
│  5V     ───────┼────────>│  VDD             │
│  3.3V   ───────┼────────>│  VIO             │
│  GND    ───────┼────────>│  GND             │
└─────────────────┘         └──────────────────┘
                                     │
                            ┌────────┴────────┐
                            │                 │
                    External Supply      Test Load
                    ──────────────      ──────────
                    12-24V ──────> VBAT  OUT0 ──> Load
                    GND   ──────> GND   GND  ──> Return

Complete Pin Configuration

Function	ESP32-C6 GPIO	TLE92466ED Pin	Configuration	Notes
SPI MISO	GPIO2	MISO	Input	Data from TLE92466ED
SPI MOSI	GPIO7	MOSI	Output	Data to TLE92466ED
SPI SCLK	GPIO6	SCLK	Output	1MHz SPI Clock
SPI CS	GPIO18	CS	Output	Active Low
RESN	GPIO21	RESN	Output	Reset pin (active low)
EN	GPIO20	EN	Output	Enable pin (active high)
FAULTN	GPIO19	FAULTN	Input	Fault pin (active low)
Test Indicator	GPIO14	-	Output	Progress indicator
VDD Supply	5V	VDD	Power	5V (Required for IC operation)
VIO Supply	3.3V/5V	VIO	Power	3.0-5.5V (Required for SPI)
Load Supply	External	VBAT	Power	5.5-41V, 2A+ (Optional for SPI)
Ground	GND	GND	Ground	Common reference

GPIO14 Test Indicator Setup

ESP32-C6 GPIO14 ──┬── LED (Anode)
                  │   └── LED (Cathode) ── 220Ω ── GND
                  │
                  └── Oscilloscope/Logic Analyzer Probe

Purpose: Visual and measurable feedback showing test progression

Power Supply Requirements

┌─────────────────────────────────────────────────┐
│  Power Supply Requirements                      │
├─────────────────────────────────────────────────┤
│                                                 │
│  VDD (Internal Logic Supply):                   │
│    └─ 5V input to TLE92466ED                    │
│    └─ Powers central logic of the IC            │
│    └─ Required for IC operation                  │
│                                                 │
│  VIO (I/O Level Supply):                        │
│    └─ 3.0V to 5.5V (input)                       │
│    └─ Sets I/O voltage levels for SPI           │
│    └─ Required for SPI communication             │
│    └─ Typical: 3.3V or 5.0V                     │
│    └─ Typical current: 10-20mA                  │
│                                                 │
│  VBAT (Load Supply):                            │
│    └─ 5.5V to 41V (recommended operating)       │
│    └─ Typical: 12V or 24V automotive            │
│    └─ NOT required for SPI communication        │
│    └─ Required for actual load operation        │
│    └─ Typical: 2A+ per channel                   │
│                                                 │
└─────────────────────────────────────────────────┘

Important: For this driver integration test, VBAT is not required. The test validates SPI communication and driver logic only. VDD is required (powers central logic). VIO is required for SPI communication (sets I/O voltage levels).

Configuration

Hardware Configuration (`main/TLE92466ED_TestConfig.hpp`)

All hardware-specific settings are centralized:

namespace TLE92466ED_TestConfig {

struct SPIPins {
    static constexpr uint8_t MISO = 2;   // GPIO2
    static constexpr uint8_t MOSI = 7;   // GPIO7
    static constexpr uint8_t SCLK = 6;   // GPIO6
    static constexpr uint8_t CS = 18;    // GPIO18
};

struct ControlPins {
    static constexpr uint8_t RESN = 21;   // GPIO21
    static constexpr uint8_t EN = 20;     // GPIO20
    static constexpr uint8_t FAULTN = 19; // GPIO19
    static constexpr uint8_t DRV0 = 22;   // GPIO22
    static constexpr uint8_t DRV1 = 23;   // GPIO23
};

struct SPIParams {
    static constexpr uint32_t FREQUENCY = 1000000;  // 1MHz
    static constexpr uint8_t MODE = 1;              // SPI Mode 1 (CPOL=0, CPHA=1)
    static constexpr uint8_t QUEUE_SIZE = 1;
    static constexpr uint8_t CS_ENA_PRETRANS = 1;
    static constexpr uint8_t CS_ENA_POSTTRANS = 1;
};

} // namespace TLE92466ED_TestConfig

To modify hardware settings: Edit main/TLE92466ED_TestConfig.hpp

Test Configuration (`main/DriverIntegrationTest.cpp`)

Enable/disable test sections at compile time:

// Enable/disable test sections (set to 0 to skip a section)
#define ENABLE_INITIALIZATION_TESTS 1
#define ENABLE_MODE_CONTROL_TESTS 1
#define ENABLE_GLOBAL_CONFIG_TESTS 1
#define ENABLE_CHANNEL_CONTROL_TESTS 1
#define ENABLE_CURRENT_CONTROL_TESTS 1
#define ENABLE_PWM_CONFIG_TESTS 1
#define ENABLE_DITHER_CONFIG_TESTS 1
#define ENABLE_DIAGNOSTICS_TESTS 1
#define ENABLE_FAULT_MANAGEMENT_TESTS 1
#define ENABLE_WATCHDOG_TESTS 1
#define ENABLE_GPIO_CONTROL_TESTS 1
#define ENABLE_MULTI_CHANNEL_TESTS 1
#define ENABLE_PARALLEL_OPERATION_TESTS 1
#define ENABLE_ERROR_CONDITION_TESTS 1

To disable a section: Set to 0 and rebuild. This allows you to run only specific test categories during development or debugging.

Build Configuration (`app_config.yml`)

Application metadata and build settings:

apps:
  driver_integration_test:
    description: "Comprehensive driver integration test suite (no hardware required)"
    source_file: "DriverIntegrationTest.cpp"
    category: "test"
    idf_versions: ["release/v5.5"]
    build_types: ["Debug", "Release"]
    ci_enabled: true
    featured: true

Note: This is for build metadata only. Hardware config is in TLE92466ED_TestConfig.hpp.

Building and Running

Quick Start

cd examples/esp32

# Build the driver integration test
./scripts/build_app.sh driver_integration_test Debug

# Flash to ESP32-C6
./scripts/flash_app.sh driver_integration_test Debug

# Monitor output
./scripts/monitor_app.sh driver_integration_test

Manual Build

cd examples/esp32

# Set target
idf.py set-target esp32c6

# Configure (optional)
idf.py menuconfig

# Build with APP_TYPE=driver_integration_test
idf.py -DAPP_TYPE=driver_integration_test build

# Flash
idf.py -p /dev/ttyUSB0 flash

# Monitor
idf.py -p /dev/ttyUSB0 monitor

Build Targets

# Debug build (optimized for debugging)
idf.py -DAPP_TYPE=driver_integration_test -DCMAKE_BUILD_TYPE=Debug build

# Release build (optimized for performance)
idf.py -DAPP_TYPE=driver_integration_test -DCMAKE_BUILD_TYPE=Release build

Expected Output

Test Header

╔══════════════════════════════════════════════════════════════════════════════╗
║         TLE92466ED DRIVER INTEGRATION TEST SUITE - ESP32-C6                 ║
║                         HardFOC Core Drivers                              ║
╚══════════════════════════════════════════════════════════════════════════════╝
Target: esp32c6
ESP-IDF Version: v5.5.1

╔══════════════════════════════════════════════════════════════════════════════╗
║ TLE92466ED TEST CONFIGURATION                                                
╠══════════════════════════════════════════════════════════════════════════════╣
║ Test sections will execute based on compile-time configuration              ║
║ GPIO14 test progression indicator: ENABLED                                   ║
╚══════════════════════════════════════════════════════════════════════════════╝

Test Execution

╔══════════════════════════════════════════════════════════════════════════════╗
║ SECTION: INITIALIZATION TESTS                                                ║
╚══════════════════════════════════════════════════════════════════════════════╝
[GPIO14: Blink pattern - 5 blinks]

╔══════════════════════════════════════════════════════════════════════════════╗
║ Running (task): hal_initialization                                           ║
╚══════════════════════════════════════════════════════════════════════════════╝
I (1234) TLE92466ED_Test: Creating HAL instance...
I (1235) Esp32TleComm: Esp32TleCommInterface created with SPI config
I (1236) Esp32TleComm:   MISO: GPIO2, MOSI: GPIO7, SCLK: GPIO6, CS: GPIO18
I (1237) Esp32TleComm:   Frequency: 1000000 Hz, Mode: 1
I (1238) TLE92466ED_Test: Initializing HAL...
I (1240) Esp32TleComm: Esp32TleCommInterface initialized successfully
I (1241) TLE92466ED_Test: ✅ HAL initialized successfully
[SUCCESS] PASSED (task): hal_initialization (12.34 ms)
Test task completed: hal_initialization
[GPIO14: Toggle HIGH]

Test Results Summary

╔══════════════════════════════════════════════════════════════════════════════╗
║                           TEST RESULTS SUMMARY                               ║
╠══════════════════════════════════════════════════════════════════════════════╣
║  Total Tests:      40+                                                       ║
║  Passed:           40+                                                       ║
║  Failed:           0                                                         ║
║  Success Rate:     100.00%                                                   ║
║  Total Time:       ~10-15 seconds                                            ║
╚══════════════════════════════════════════════════════════════════════════════╝

I (15000) TLE92466ED_Test: ✅ ALL TESTS PASSED! System will restart in 10 seconds...

GPIO14 Signal Pattern

Time    │ GPIO14 │ Event
────────┼────────┼──────────────────────────────
0ms     │   LOW  │ Boot
100ms   │ BLINK  │ Section start (5 blinks)
        │   ↑↓   │ 
200ms   │  HIGH  │ Test 1 complete
300ms   │   LOW  │ Test 2 complete
400ms   │  HIGH  │ Test 3 complete
500ms   │ BLINK  │ Section 2 start (5 blinks)
600ms   │   LOW  │ Test 4 complete
...

Test Coverage

Complete API Coverage

This test suite covers all TLE92466ED driver functionality:

Initialization & Device Information

HAL initialization
Driver initialization
Chip ID reading
IC version reading
Device verification

Mode Management

Mission Mode entry/exit
Config Mode entry/exit
Mode transition validation

Global Configuration

CRC enable/disable
VBAT threshold configuration (high-level and raw)
Complete global configuration

Channel Control

Single channel enable/disable
All channels control
Channel mask control
Channel mode configuration (all modes)

Current Control

Current setpoint setting (with read-back)
Current ramping (smooth transitions)

PWM Configuration

High-level API (period in microseconds)
Low-level API (mantissa, exponent, low_freq_range)

Dither Configuration

High-level API (amplitude in mA, frequency in Hz)
Low-level API (step_size, num_steps, flat_steps)

Diagnostics & Monitoring

Device status reading
Channel diagnostics
Voltage reading (VBAT, VIO)
Current and duty cycle reading
Telemetry for all channels
Device-level telemetry
Telemetry with active channels

Fault Management

Fault clearing
Software reset

Watchdog

SPI watchdog reload

GPIO Control

Reset pin control
Enable pin control
Fault pin reading

Multi-Channel Operations

All 6 channels individually tested

Parallel Operation

Parallel pair configuration

Error Handling

Wrong mode operation validation
Error condition testing

Individual Test Details

Initialization Tests

`test_hal_initialization()`

Purpose: Validate ESP32-C6 HAL creation and SPI initialization

Operations:

Create Esp32TleCommInterface instance with configuration from TLE92466ED_TestConfig.hpp
Initialize SPI peripheral (SPI2_HOST)
Configure GPIO pins for SPI
Set up SPI parameters (1MHz, Mode 1)

Expected Result: ✅ PASS

HAL instance created successfully
SPI bus initialized
GPIO pins configured
Ready for communication

Failure Modes:

SPI bus already initialized
GPIO pins in use
Invalid SPI configuration
Hardware fault

`test_driver_initialization()`

Purpose: Create TLE92466ED driver instance and initialize IC

Operations:

Create TLE92466ED driver instance with HAL reference
Execute driver initialization sequence
Configure TLE92466ED registers
Set up default parameters

Expected Result: ✅ PASS

Driver instance created
IC initialized successfully
Registers configured
Ready for operations

Failure Modes:

HAL not initialized
SPI communication failure
TLE92466ED not powered (VIO required for SPI)
IC initialization timeout

Telemetry Tests

`test_all_channels_telemetry()`

Purpose: Test telemetry reading for all 6 channels

Operations:

Iterate through all channels (CH0-CH5)
For each channel, test:
- GetCurrentSetpoint() - Read current setpoint
- GetAverageCurrent() - Read average current
- GetDutyCycle() - Read PWM duty cycle
- GetChannelDiagnostics() - Read complete diagnostics
Report faults and warnings

Expected Result: ✅ PASS

All telemetry functions work for all channels
Values read successfully (may be 0 if channels not enabled)

Telemetry Data Read:

Current setpoint (mA)
Average current (mA)
Duty cycle (raw 16-bit value)
Diagnostics (faults, warnings, min/max current)

`test_device_telemetry()`

Purpose: Test device-level telemetry reading

Operations:

Read device status (GetDeviceStatus())
Read VBAT voltage (GetVbatVoltage())
Read VIO voltage (GetVioVoltage())
Read fault pin status (IsFault())

Expected Result: ✅ PASS

All device telemetry functions work
Status information displayed
Voltage readings obtained

Telemetry Data Read:

Device mode (Config/Mission)
Initialization status
Fault conditions
Supply voltages (VBAT, VIO)
Fault pin state

`test_telemetry_with_active_channel()`

Purpose: Test telemetry with an active channel (enabled with current set)

Operations:

Enter Mission Mode
Enable outputs (EN pin)
Set current setpoint to 500mA
Enable channel
Wait for current to stabilize (500ms)
Read all telemetry:
- Current setpoint
- Average current
- Duty cycle
- Complete diagnostics
Verify values are reasonable
Disable channel

Expected Result: ✅ PASS

All telemetry functions work with active channel
Current setpoint matches set value
Average current is measured
Duty cycle is non-zero
Diagnostics show channel is active

Telemetry Validation:

Setpoint matches configured value
Average current is within reasonable range
Duty cycle reflects current regulation
No unexpected faults

Mode Control Tests

`test_mode_transitions()`

Purpose: Validate mode transitions work correctly

Operations:

Perform 3 cycles of Config → Mission → Config transitions
Verify mode state after each transition
Ensure no errors occur

Expected Result: ✅ PASS

All mode transitions succeed
Mode state is correct after each transition
No communication errors

Error Condition Tests

`test_error_conditions()`

Purpose: Verify proper error handling

Operations:

Try to enable channel in Config Mode (should fail)
Try to configure channel mode in Mission Mode (should fail)
Try to configure global settings in Mission Mode (should fail)
Verify all operations correctly return errors

Expected Result: ✅ PASS

All invalid operations correctly rejected
Appropriate error codes returned
No crashes or undefined behavior

Troubleshooting

Common Issues

1. All Tests Fail ❌

Symptom: Every test returns FAILED

Root Causes:

TLE92466ED not powered (check VIO: 3.0-5.5V, typical 3.3V or 5.0V)
SPI wiring incorrect
Common ground missing
ESP32-C6 not programmed correctly

Solutions:

# Check wiring
- VIO: 3.0-5.5V present (REQUIRED for SPI, typical 3.3V or 5.0V)
- GND: Common ground between ESP32-C6, TLE92466ED
- SPI pins: MISO, MOSI, SCLK, CS connected correctly
- RESN: Must be HIGH (not in reset)

# Re-flash
idf.py -p /dev/ttyUSB0 erase-flash
idf.py -p /dev/ttyUSB0 flash

2. HAL Initialization Fails ❌

Symptom: test_hal_initialization fails

Root Causes:

SPI2 bus already in use
GPIO pins conflicting
Invalid SPI configuration

Solutions:

Check sdkconfig for SPI conflicts
Verify GPIO pins are not used elsewhere
Try different GPIO pins (modify TLE92466ED_TestConfig.hpp)
Check ESP32-C6 hardware

3. Driver Initialization Fails ❌

Symptom: test_driver_initialization fails

Root Causes:

SPI communication not working
TLE92466ED not responding
Power supply issue (VIO required for SPI)

Solutions:

Verify SPI with logic analyzer/oscilloscope
Check VIO voltage (must be 3.0V to 5.5V, typical 3.3V or 5.0V)
Check VBAT voltage if testing with loads (5.5V to 41V, typical 12V or 24V)
Verify RESN pin is HIGH (not in reset)
Verify TLE92466ED is not damaged
Check VDD voltage (must be 5V) - powers central logic of the IC
Check VIO voltage (must be 3.0V to 5.5V, typical 3.3V or 5.0V) - sets SPI I/O levels

4. Telemetry Tests Fail ⚠️

Symptom: Telemetry reading functions fail

Root Causes:

Channels not enabled (expected for some tests)
Device not in correct mode
Register read errors

Solutions:

Check if test expects channels to be enabled
Verify device is in correct mode (Config vs Mission)
Check SPI communication is working
Some telemetry failures are expected if channels are disabled

Performance Characteristics

Typical Execution Times

Test Section	Expected Time	Max Time
Initialization Tests	50-100 ms	200 ms
Mode Control Tests	30-50 ms	100 ms
Global Configuration Tests	200-300 ms	500 ms
Channel Control Tests	500-800 ms	1500 ms
Current Control Tests	2000-3000 ms	5000 ms
PWM Configuration Tests	300-500 ms	1000 ms
Dither Configuration Tests	300-500 ms	1000 ms
Diagnostics Tests	1000-1500 ms	3000 ms
Fault Management Tests	100-200 ms	400 ms
Watchdog Tests	200-300 ms	500 ms
GPIO Control Tests	200-300 ms	500 ms
Multi-Channel Tests	2000-3000 ms	5000 ms
Parallel Operation Tests	300-500 ms	1000 ms
Error Condition Tests	100-200 ms	400 ms
Total Suite	~10-15 seconds	~30 seconds

Memory Usage

Resource	Usage	Notes
Flash	~350KB	Driver + HAL + test framework
RAM (static)	~15KB	Driver instance + buffers
Stack (per task)	8KB	Configurable in `RUN_TEST_IN_TASK`
Heap (dynamic)	~5KB	HAL instance + std::unique_ptr

SPI Performance

Clock Frequency: 1MHz (datasheet range: 0.1MHz - 10MHz)
Transaction Time: ~32μs per 32-bit frame
Register Read: ~100μs (including overhead)
Register Write: ~80μs (including overhead)

ESP32 Examples

Solenoid Control Test - Real hardware solenoid testing
Test Framework Reference - Framework API
Hardware Configuration - Pin and parameter config
ESP32-C6 CommInterface - CommInterface implementation details

Driver Documentation

Driver API Reference - Complete API documentation
CommInterface Implementation Guide - Porting to new platforms
Register Map - TLE92466ED register details
Diagnostics - Fault detection and handling

Build System

App Configuration - Build metadata
CMake Setup - Build system configuration
Component Structure - ESP-IDF component

Notes

This test suite is designed to validate driver functionality without requiring actual solenoids
All tests are independent and can be enabled/disabled individually
The suite validates both high-level and low-level APIs
Error conditions are tested to ensure proper validation
The suite covers all driver functionality
Test execution time depends on enabled sections (typically 10-15 seconds for full suite)
VBAT is not required for this test - only VDD and VIO are needed for SPI communication

Example: Driver Integration Test Suite
Platform: ESP32-C6
Framework: FreeRTOS + Test Framework
Test Sections: 13
Total Tests: 40+
Status: ✅ Production Ready
Hardware Required: TLE92466ED IC (no solenoids needed)

Driver Integration Test Suite - TLE92466ED ESP32-C6

Table of Contents

Overview

Key Features

Purpose

Test Framework Architecture

FreeRTOS Task-Based Execution

GPIO14 Progress Indicator

Automatic Result Tracking

Test Section Management

Test Suite Structure

Test Sections

1. INITIALIZATION_TESTS (#define ENABLE_INITIALIZATION_TESTS 1)

2. MODE_CONTROL_TESTS (#define ENABLE_MODE_CONTROL_TESTS 1)

3. GLOBAL_CONFIGURATION_TESTS (#define ENABLE_GLOBAL_CONFIG_TESTS 1)

4. CHANNEL_CONTROL_TESTS (#define ENABLE_CHANNEL_CONTROL_TESTS 1)

5. CURRENT_CONTROL_TESTS (#define ENABLE_CURRENT_CONTROL_TESTS 1)

6. PWM_CONFIGURATION_TESTS (#define ENABLE_PWM_CONFIG_TESTS 1)

7. DITHER_CONFIGURATION_TESTS (#define ENABLE_DITHER_CONFIG_TESTS 1)

8. DIAGNOSTICS_TESTS (#define ENABLE_DIAGNOSTICS_TESTS 1)

9. FAULT_MANAGEMENT_TESTS (#define ENABLE_FAULT_MANAGEMENT_TESTS 1)

10. WATCHDOG_TESTS (#define ENABLE_WATCHDOG_TESTS 1)

11. GPIO_CONTROL_TESTS (#define ENABLE_GPIO_CONTROL_TESTS 1)

12. MULTI_CHANNEL_TESTS (#define ENABLE_MULTI_CHANNEL_TESTS 1)

13. PARALLEL_OPERATION_TESTS (#define ENABLE_PARALLEL_OPERATION_TESTS 1)

14. ERROR_CONDITION_TESTS (#define ENABLE_ERROR_CONDITION_TESTS 1)

Test Function Signatures

Hardware Setup

Required Components

Wiring Diagram

Complete Pin Configuration

GPIO14 Test Indicator Setup

Power Supply Requirements

Configuration

Hardware Configuration (main/TLE92466ED_TestConfig.hpp)

Test Configuration (main/DriverIntegrationTest.cpp)

Build Configuration (app_config.yml)

Building and Running

Quick Start

Manual Build

Build Targets

Expected Output

Test Header

Test Execution

Test Results Summary

GPIO14 Signal Pattern

Test Coverage

Complete API Coverage

Initialization & Device Information

Mode Management

Global Configuration

Channel Control

Current Control

PWM Configuration

Dither Configuration

Diagnostics & Monitoring

Fault Management

Watchdog

GPIO Control

Multi-Channel Operations

Parallel Operation

Error Handling

Individual Test Details

Initialization Tests

test_hal_initialization()

test_driver_initialization()

Telemetry Tests

test_all_channels_telemetry()

test_device_telemetry()

test_telemetry_with_active_channel()

Mode Control Tests

test_mode_transitions()

Error Condition Tests

test_error_conditions()

Troubleshooting

Common Issues

1. All Tests Fail ❌

2. HAL Initialization Fails ❌

3. Driver Initialization Fails ❌

4. Telemetry Tests Fail ⚠️

1. INITIALIZATION_TESTS (`#define ENABLE_INITIALIZATION_TESTS 1`)

2. MODE_CONTROL_TESTS (`#define ENABLE_MODE_CONTROL_TESTS 1`)

3. GLOBAL_CONFIGURATION_TESTS (`#define ENABLE_GLOBAL_CONFIG_TESTS 1`)

4. CHANNEL_CONTROL_TESTS (`#define ENABLE_CHANNEL_CONTROL_TESTS 1`)

5. CURRENT_CONTROL_TESTS (`#define ENABLE_CURRENT_CONTROL_TESTS 1`)

6. PWM_CONFIGURATION_TESTS (`#define ENABLE_PWM_CONFIG_TESTS 1`)

7. DITHER_CONFIGURATION_TESTS (`#define ENABLE_DITHER_CONFIG_TESTS 1`)

8. DIAGNOSTICS_TESTS (`#define ENABLE_DIAGNOSTICS_TESTS 1`)

9. FAULT_MANAGEMENT_TESTS (`#define ENABLE_FAULT_MANAGEMENT_TESTS 1`)

10. WATCHDOG_TESTS (`#define ENABLE_WATCHDOG_TESTS 1`)

11. GPIO_CONTROL_TESTS (`#define ENABLE_GPIO_CONTROL_TESTS 1`)

12. MULTI_CHANNEL_TESTS (`#define ENABLE_MULTI_CHANNEL_TESTS 1`)

13. PARALLEL_OPERATION_TESTS (`#define ENABLE_PARALLEL_OPERATION_TESTS 1`)

14. ERROR_CONDITION_TESTS (`#define ENABLE_ERROR_CONDITION_TESTS 1`)

Hardware Configuration (`main/TLE92466ED_TestConfig.hpp`)

Test Configuration (`main/DriverIntegrationTest.cpp`)

Build Configuration (`app_config.yml`)

`test_hal_initialization()`

`test_driver_initialization()`

`test_all_channels_telemetry()`

`test_device_telemetry()`

`test_telemetry_with_active_channel()`

`test_mode_transitions()`

`test_error_conditions()`