TLE92466ED_Config::TestConfig Struct Reference

Test Configuration. More...

#include <TLE92466ED_Config.hpp>

Static Public Attributes
static constexpr uint16_t	DEFAULT_TEST_CURRENT = 500
	Default test current (mA)
static constexpr uint32_t	TEST_DURATION_MS = 5000
	Test duration (ms)
static constexpr uint16_t	RAMP_STEP_MA = 100
	Current ramp step size (mA)
static constexpr uint32_t	RAMP_STEP_DELAY_MS = 500
	Delay between ramp steps (ms)

Detailed Description

Test Configuration.

Default parameters for testing and calibration.

Member Data Documentation

DEFAULT_TEST_CURRENT

constexpr uint16_t TLE92466ED_Config::TestConfig::DEFAULT_TEST_CURRENT = 500

staticconstexpr

Default test current (mA)

RAMP_STEP_DELAY_MS

constexpr uint32_t TLE92466ED_Config::TestConfig::RAMP_STEP_DELAY_MS = 500

staticconstexpr

Delay between ramp steps (ms)

RAMP_STEP_MA

constexpr uint16_t TLE92466ED_Config::TestConfig::RAMP_STEP_MA = 100

staticconstexpr

Current ramp step size (mA)

TEST_DURATION_MS

constexpr uint32_t TLE92466ED_Config::TestConfig::TEST_DURATION_MS = 5000

staticconstexpr

Test duration (ms)

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The documentation for this struct was generated from the following file:

• examples/esp32/main/TLE92466ED_Config.hpp