TLE92466ED ESP32 Examples Documentation

📚 Documentation Index

Complete documentation for TLE92466ED driver examples on ESP32-C6.

🎯 Quick Start

Document Purpose When to Read
Basic Usage Test Suite Your first example Start here!
Configuration Guide All configuration options Before customizing
Test Framework Reference Framework API details Writing custom tests

📖 Documentation Structure

1. Basic Usage Test Suite

Comprehensive guide to the basic usage example

Contents

  • ✅ Test Framework Architecture - How the test infrastructure works
  • ✅ Test Suite Structure - All test sections and functions
  • ✅ Hardware Setup - Complete wiring diagrams and pin configurations
  • ✅ Configuration - Hardware and test settings
  • ✅ Building and Running - Build commands and workflows
  • ✅ Expected Output - Full example outputs with explanations
  • ✅ Individual Test Details - Deep dive into each test
  • ✅ Troubleshooting - Common issues and solutions
  • ✅ Performance Characteristics - Timing and memory usage

Start here if you’re new to the examples!

2. Configuration Guide

Complete reference for all configuration files and options

Contents

  • ✅ Hardware Configuration (TLE92466ED_Config.hpp) - SPI pins, frequencies, current limits
  • ✅ Application Configuration (app_config.yml) - Build metadata and app definitions
  • ✅ Test Section Configuration - Compile-time test enable/disable
  • ✅ ESP-IDF SDK Configuration (sdkconfig) - Framework settings
  • ✅ Component Configuration - ESP-IDF component setup
  • ✅ Configuration Workflows - Development and production setups
  • ✅ Troubleshooting - Configuration-related issues

Read this when you need to customize hardware or build settings.

3. Test Framework Reference

Detailed API reference for the TLE92466ED Test Framework

Contents

  • ✅ GPIO14 Progress Indicator - Visual feedback system
  • ✅ Test Result Tracking - Automatic pass/fail counting
  • ✅ Test Execution Macros - RUN_TEST, RUN_TEST_IN_TASK, sections
  • ✅ Usage Guide - How to write test functions
  • ✅ Advanced Usage - Custom contexts, stack sizes, timeouts
  • ✅ Best Practices - Professional test organization
  • ✅ Performance Impact - Memory and timing overhead
  • ✅ CI/CD Integration - Automated testing

Essential reading for creating custom tests or understanding the framework.

🚀 Getting Started

Prerequisites

  • Hardware:
    • ESP32-C6-DevKitC-1 development board
    • TLE92466ED evaluation board or custom PCB
    • 12-24V power supply (2A minimum)
    • Test load (solenoid, resistor, or LED)
    • USB-C cable for programming
  • Software:
    • ESP-IDF v5.3 or later (v5.5 recommended)
    • Python 3.8+
    • Git with submodules support
    • Serial terminal (screen, minicom, or built-in monitor)

Quick Start Steps

  1. Clone and setup: 
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3

    git clone https://github.com/N3b3x/hf-tle92466ed-driver.git
cd hf-tle92466ed-driver/examples/esp32
git submodule update --init --recursive
  2. Configure ESP-IDF: 
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    . $IDF_PATH/export.sh
idf.py set-target esp32c6
  3. Build basic example: 
    1

    ./scripts/build_app.sh basic_usage Debug
  4. Flash and monitor: 
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    ./scripts/flash_app.sh basic_usage Debug
./scripts/monitor_app.sh basic_usage
  5. See results:
    • Serial output shows test execution
    • GPIO14 toggles with test progress
    • Summary printed at end

📊 Example Overview

BasicUsageExample

Purpose: Validate TLE92466ED driver functionality with comprehensive test suite

Test Sections:

  1. INITIALIZATION_TESTS - HAL setup, driver init, chip ID verification
  2. BASIC_OPERATION_TESTS - Channel control, current setting, diagnostics
  3. CURRENT_CONTROL_TESTS - Current ramping and smooth transitions

Features:

  • ✅ FreeRTOS task-based test execution
  • ✅ GPIO14 progress indicator
  • ✅ Automatic result tracking
  • ✅ Professional formatted output
  • ✅ 30-second timeout per test
  • ✅ Compile-time test section control

Complexity: ⭐⭐⭐☆☆

Read: Basic Usage Test Suite

MultiChannelExample

Purpose: Demonstrate independent control of all 6 TLE92466ED channels

Features (planned):

  • Sequential channel activation
  • Synchronized channel control
  • Wave patterns across channels
  • Performance monitoring
  • Advanced diagnostics

Complexity: ⭐⭐⭐⭐☆

Status: 🚧 In Development

🔧 Configuration Overview

Hardware Configuration

File: main/TLE92466ED_Config.hpp

What’s configured:

  • SPI GPIO pins (MISO, MOSI, SCLK, CS)
  • SPI frequency and mode
  • Current limits (single and parallel)
  • Hardware specifications (voltage, temperature)
  • Test parameters

Example: cpp struct SPIPins { static constexpr int MISO = 2; // GPIO2 static constexpr int MOSI = 7; // GPIO7 static constexpr int SCLK = 6; // GPIO6 static constexpr int CS = 10; // GPIO10 }; text

Read: Configuration Guide - Hardware Configuration

Build Configuration

File: app_config.yml

What’s configured:

  • Available applications (basic_usage, multi_channel, etc.)
  • Build types (Debug, Release)
  • ESP-IDF version compatibility
  • CI/CD settings
  • Documentation links

Example: yaml apps: basic_usage: description: "Basic usage example for TLE92466ED" source_file: "BasicUsageExample.cpp" build_types: ["Debug", "Release"] text

Read: Configuration Guide - Application Configuration

Test Configuration

File: Each example source file (e.g., BasicUsageExample.cpp)

What’s configured:

  • Test section enable/disable flags
  • Compile-time test selection

Example: cpp #define ENABLE_INITIALIZATION_TESTS 1 // Enable #define ENABLE_BASIC_OPERATION_TESTS 1 // Enable #define ENABLE_CURRENT_CONTROL_TESTS 0 // Disable text

Read: Configuration Guide - Test Section Configuration

🧪 Test Framework Features

Professional Test Infrastructure

The examples use a production-grade test framework with:

✅ FreeRTOS Task-Based Execution

  • Each test runs in isolated task
  • Custom stack size per test (default: 8KB)
  • Automatic semaphore synchronization
  • 30-second timeout protection

✅ GPIO14 Progress Indicator

  • Visual feedback on oscilloscope/logic analyzer
  • Toggle: HIGH/LOW on test completion
  • Blink patterns: 5 blinks at section boundaries
  • Hardware-level progress tracking

✅ Automatic Result Tracking

  • Pass/fail counting
  • Microsecond-precision execution timing
  • Success rate calculation
  • Professional formatted summaries

✅ Test Section Management

  • Compile-time section enable/disable
  • Organized test grouping
  • Custom blink patterns per section

Read: Test Framework Reference

📈 Example Output

Test Execution

```text ╔══════════════════════════════════════════════════════════════════╗ ║ TLE92466ED BASIC USAGE TEST SUITE - ESP32-C6 ║ ╚══════════════════════════════════════════════════════════════════╝ Target: esp32c6 ESP-IDF Version: v5.5.0

╔══════════════════════════════════════════════════════════════════╗ ║ SECTION: INITIALIZATION TESTS ║ ╚══════════════════════════════════════════════════════════════════╝ [GPIO14: Blink pattern - 5 blinks]

╔══════════════════════════════════════════════════════════════════╗ ║ Running (task): hal_initialization ║ ╚══════════════════════════════════════════════════════════════════╝ I (1234) TLE92466ED_Basic: Creating HAL instance… I (1235) TLE92466ED_Basic: ✅ HAL initialized successfully [SUCCESS] PASSED (task): hal_initialization (12.34 ms) [GPIO14: Toggle HIGH]

… (more tests) …

╔══════════════════════════════════════════════════════════════════╗ ║ TEST RESULTS SUMMARY ║ ╠══════════════════════════════════════════════════════════════════╣ ║ Total Tests: 7 ║ ║ Passed: 7 ║ ║ Failed: 0 ║ ║ Success Rate: 100.00% ║ ║ Total Time: 234.56 ms ║ ╚══════════════════════════════════════════════════════════════════╝

I (5000) TLE92466ED_Basic: ✅ ALL TESTS PASSED! ```text

🐛 Troubleshooting Quick Reference

Common Issues

Issue Quick Fix Full Guide
All tests fail Check VBAT power (12-24V) and wiring Basic Usage - Troubleshooting
HAL init fails Verify GPIO pins in TLE92466ED_Config.hpp Configuration - GPIO Conflict
Chip ID read fails Check SPI wiring, CS pin Basic Usage - Chip ID Fails
Stack overflow Increase stack size in RUN_TEST_IN_TASK Configuration - Stack Overflow
Build errors Clean and rebuild: idf.py fullclean && idf.py build Configuration - Build Type Issues

📦 Project Structure

text examples/esp32/ ├── app_config.yml # Build metadata ├── CMakeLists.txt # Main CMake configuration ├── sdkconfig # ESP-IDF SDK configuration │ ├── main/ # Application source │ ├── CMakeLists.txt # Main component build │ ├── TLE92466ED_Config.hpp # Hardware configuration │ ├── TLE92466ED_TestFramework.hpp # Test infrastructure │ ├── ESP32C6_HAL.hpp/.cpp # ESP32-C6 HAL implementation │ ├── BasicUsageExample.cpp # Basic test suite │ └── MultiChannelExample.cpp # Multi-channel tests │ ├── components/ # ESP-IDF components │ └── tle92466ed-espidf/ # TLE92466ED driver component │ ├── CMakeLists.txt │ ├── idf_component.yml │ └── README.md │ ├── docs/ # Documentation │ ├── README.md # This file │ ├── README_BASIC_USAGE.md # Basic usage guide │ ├── README_CONFIGURATION.md # Configuration reference │ └── README_TEST_FRAMEWORK.md # Test framework API │ └── scripts/ # Build/flash scripts (submodule) ├── build_app.sh ├── flash_app.sh └── monitor_app.sh text

🔗 Related Documentation

Driver Documentation

ESP32 Resources

TLE92466ED Resources

🎓 Learning Path

Beginner Path

  1. Read: Basic Usage Test Suite
  2. Build: Basic usage example (Debug mode)
  3. Run: Flash to ESP32-C6 and observe output
  4. Modify: Change current values in tests
  5. Experiment: Try with different loads

Intermediate Path

  1. Read: Configuration Guide
  2. Customize: Modify TLE92466ED_Config.hpp for your hardware
  3. Configure: Adjust test sections and parameters
  4. Optimize: Try Release build, measure performance
  5. Debug: Use oscilloscope to observe SPI and GPIO14

Advanced Path

  1. Read: Test Framework Reference
  2. Extend: Add custom test functions
  3. Port: Implement HAL for different MCU (ESP32-S3, etc.)
  4. Integrate: Set up CI/CD pipeline with test parsing
  5. Optimize: Profile and optimize for your application

💡 Tips and Best Practices

Development Tips

  1. Start with Debug builds for detailed logging
  2. Use GPIO14 indicator to track progress without serial
  3. Monitor SPI signals with logic analyzer during bring-up
  4. Test with known-good load (resistor) before real solenoids
  5. Enable all test sections initially, disable as needed

Configuration Tips

  1. Keep hardware config centralized in TLE92466ED_Config.hpp
  2. Use compile-time flags for test sections (faster than runtime)
  3. Document custom settings in code comments
  4. Version control sdkconfig.defaults for team consistency
  5. Use Release builds for final performance testing

Testing Tips

  1. Run full test suite after any changes
  2. Check GPIO14 patterns on oscilloscope for test flow
  3. Analyze execution times to find performance issues
  4. Test with realistic loads matching your application
  5. Monitor diagnostics for fault conditions

🆘 Getting Help

Documentation Issues

If documentation is unclear or incomplete:

  1. Check the specific guide (Basic Usage, Configuration, Test Framework)
  2. Search for keywords in all docs
  3. Review related driver documentation
  4. Open GitHub issue with details

Build/Configuration Issues

If you have build or configuration problems:

  1. Check Configuration Guide - Troubleshooting
  2. Verify ESP-IDF version (v5.3+)
  3. Clean and rebuild: idf.py fullclean && idf.py build
  4. Check sdkconfig for conflicts

Hardware/Test Issues

If tests fail or hardware doesn’t work:

  1. Check Basic Usage - Troubleshooting
  2. Verify wiring against pin configuration
  3. Measure power supplies (VBAT, VDD)
  4. Test SPI communication with logic analyzer
  5. Try lower SPI frequency (100kHz) for debugging

Support Channels

  • GitHub Issues: Bug reports, feature requests
  • GitHub Discussions: Questions, general help
  • Driver Documentation: Technical reference

📊 Example Statistics

BasicUsageExample

Metric Value
Total Tests 7
Test Sections 3
Typical Execution Time 200-250ms
Flash Size ~55KB
RAM Usage ~12KB
Stack per Task 8KB

Test Breakdown

Section Tests Time
Initialization 3 ~40ms
Basic Operations 3 ~100ms
Current Control 1 ~70ms

🎉 Success Criteria

You’ve successfully set up the examples when:

  • ✅ Build completes without errors
  • ✅ Flash and monitor show output
  • ✅ All tests pass (100% success rate)
  • ✅ GPIO14 toggles during execution
  • ✅ Test summary shows timing information
  • ✅ System restarts automatically after tests

Example success output: ```text ╔══════════════════════════════════════════════════════════════════╗ ║ TEST RESULTS SUMMARY ║ ╠══════════════════════════════════════════════════════════════════╣ ║ Total Tests: 7 ║ ║ Passed: 7 ║ ║ Failed: 0 ║ ║ Success Rate: 100.00% ║ ║ Total Time: 234.56 ms ║ ╚══════════════════════════════════════════════════════════════════╝

✅ ALL TESTS PASSED! System will restart in 10 seconds… ```text

Documentation Version: 1.0.0
Last Updated: 2025-10-21
Status: ✅ Complete

Next: Start with Basic Usage Test Suite →