Basic Usage Test Suite - TLE92466ED ESP32-C6

Overview

The Basic Usage example is a comprehensive test suite that demonstrates fundamental TLE92466ED operations on ESP32-C6 using a professional FreeRTOS-based test framework. This suite provides structured validation of driver functionality with automatic result tracking, GPIO14 progress indicators, and detailed execution timing.

🎯 Purpose

Validate TLE92466ED driver functionality on ESP32-C6
Demonstrate best practices for driver integration
Provide professional test infrastructure for development
Enable CI/CD integration with structured output
Document expected behavior and performance

🧪 Test Framework Architecture

Professional Test Infrastructure

The example uses the TLE92466ED Test Framework (TLE92466ED_TestFramework.hpp), which provides:

✅ FreeRTOS Task-Based Execution

Each test runs in isolated FreeRTOS task
Custom stack size per test (8KB default)
Automatic semaphore synchronization
30-second timeout protection
Fallback to inline execution on failure

✅ GPIO14 Progress Indicator

Visual feedback on oscilloscope/logic analyzer
Toggle: HIGH/LOW on each test completion
Blink Pattern: 5 blinks at section start/end
Hardware-level test progression tracking

✅ Automatic Result Tracking

Pass/fail counting
Microsecond-precision execution timing
Success rate calculation
Professional summary reports

✅ Test Section Management

Compile-time section enable/disable
Section-based organization
Custom blink patterns per section
Structured output formatting

📋 Test Suite Structure

Test Sections

1. INITIALIZATION_TESTS (`#define ENABLE_INITIALIZATION_TESTS 1`)

Tests fundamental setup and communication:

test_hal_initialization - ESP32-C6 HAL setup and SPI configuration
test_driver_initialization - TLE92466ED driver instance creation
test_chip_id - SPI communication verification via chip ID

2. BASIC_OPERATION_TESTS (`#define ENABLE_BASIC_OPERATION_TESTS 1`)

Tests core driver operations:

test_channel_enable_disable - Channel control operations
test_current_setting - Current configuration (100mA, 500mA, 1000mA, 1500mA)
test_diagnostics - Real-time diagnostics reading

3. CURRENT_CONTROL_TESTS (`#define ENABLE_CURRENT_CONTROL_TESTS 1`)

Tests advanced current control:

test_current_ramping - Smooth 0→1000mA→0mA transitions

Test Function Signatures

All test functions follow this pattern: cpp static bool test_function_name() noexcept;text

Key Characteristics:

Return bool (true = passed, false = failed)
Declared noexcept for embedded safety
Self-contained and isolated
Descriptive ESP_LOG output
Proper error handling with std::expected

🔧 Hardware Setup

Required Components

ESP32-C6-DevKitC-1 development board
TLE92466ED evaluation board or custom PCB
12-24V power supply for VBAT (2A minimum)
Test load: Solenoid, resistor (6-120Ω), or LED with current limiting
Oscilloscope/Logic Analyzer (optional, for GPIO14 monitoring)
Connecting wires

Wiring Diagram

```text ESP32-C6 TLE92466ED Function ——– ———- ——– GPIO2 ——-> MISO SPI Data In GPIO7 ——-> MOSI SPI Data Out GPIO6 ——-> SCLK SPI Clock GPIO10 ——-> CS Chip Select (active low) GPIO14 ——-> [LED/Scope] Test Progress Indicator 3.3V ——-> VDD Logic Supply GND ——-> GND Common Ground

External Supply TLE92466ED ————— ———- 12-24V ——> VBAT Power Supply GND ——> GND Power Ground

Test Load TLE92466ED ——— ———- Load+ ——> OUT0 Channel 0 Output Load- ——> GND (via sense) Return Path ```text

Complete Pin Configuration

Function	ESP32-C6 GPIO	TLE92466ED Pin	Configuration	Notes
SPI MISO	GPIO2	MISO	Input	Data from TLE92466ED
SPI MOSI	GPIO7	MOSI	Output	Data to TLE92466ED
SPI SCLK	GPIO6	SCLK	Output	1MHz SPI Clock
SPI CS	GPIO10	CS	Output	Active Low
Test Indicator	GPIO14	-	Output	Progress indicator
Logic Supply	3.3V	VDD	Power	3.3V ±10%
Power Supply	External	VBAT	Power	8-28V, 2A+
Ground	GND	GND	Ground	Common reference

GPIO14 Test Indicator Setup

text ESP32-C6 GPIO14 ──┬── LED (Anode) │ └── LED (Cathode) ── 220Ω ── GND │ └── Oscilloscope/Logic Analyzer Probetext

Purpose: Visual and measurable feedback showing test progression

⚙️ Configuration

Hardware Configuration (`main/TLE92466ED_Config.hpp`)

All hardware-specific settings are centralized:

```cpp namespace TLE92466ED_Config {

struct SPIPins { static constexpr int MISO = 2; // GPIO2 static constexpr int MOSI = 7; // GPIO7 static constexpr int SCLK = 6; // GPIO6 static constexpr int CS = 10; // GPIO10 };

struct SPIParams { static constexpr int FREQUENCY = 1000000; // 1MHz static constexpr int MODE = 0; // SPI Mode 0 static constexpr int QUEUE_SIZE = 7; };

struct CurrentLimits { static constexpr uint16_t SINGLE_CHANNEL_MAX = 2000; // 2A static constexpr uint16_t PARALLEL_CHANNEL_MAX = 4000; // 4A };

struct HardwareSpecs { static constexpr float SUPPLY_VOLTAGE_MIN = 8.0f; // 8V static constexpr float SUPPLY_VOLTAGE_MAX = 28.0f; // 28V static constexpr int TEMPERATURE_MAX = 150; // 150°C };

} // namespace TLE92466ED_Config ```text

To modify hardware settings: Edit main/TLE92466ED_Config.hpp

Test Configuration (`main/BasicUsageExample.cpp`)

Enable/disable test sections at compile time:

cpp #define ENABLE_INITIALIZATION_TESTS 1 // HAL, driver, chip ID #define ENABLE_BASIC_OPERATION_TESTS 1 // Enable, current, diagnostics #define ENABLE_CURRENT_CONTROL_TESTS 1 // Ramping teststext

To disable a section: Set to 0 and rebuild

Build Configuration (`app_config.yml`)

Application metadata and build settings:

yaml apps: basic_usage: description: "Basic usage example for TLE92466ED" source_file: "BasicUsageExample.cpp" category: "demo" idf_versions: ["release/v5.5"] build_types: ["Debug", "Release"] ci_enabled: true featured: truetext

Note: This is for build metadata only. Hardware config is in TLE92466ED_Config.hpp.

🚀 Building and Running

Quick Start

```bash cd examples/esp32

Build the basic usage example

./scripts/build_app.sh basic_usage Debug

Flash to ESP32-C6

./scripts/flash_app.sh basic_usage Debug

Monitor output

./scripts/monitor_app.sh basic_usage ```text

Manual Build

```bash cd examples/esp32

Set target

idf.py set-target esp32c6

Configure (optional)

idf.py menuconfig

Build with APP_TYPE=basic_usage

idf.py -DAPP_TYPE=basic_usage build

Flash

idf.py -p /dev/ttyUSB0 flash

Monitor

idf.py -p /dev/ttyUSB0 monitor ```text

Build Targets

```bash

Debug build (optimized for debugging)

idf.py -DAPP_TYPE=basic_usage -DCMAKE_BUILD_TYPE=Debug build

Release build (optimized for performance)

idf.py -DAPP_TYPE=basic_usage -DCMAKE_BUILD_TYPE=Release build ```text

📊 Expected Output

Professional Test Header

```text ╔══════════════════════════════════════════════════════════════════════════════╗ ║ TLE92466ED BASIC USAGE TEST SUITE - ESP32-C6 ║ ║ HardFOC Core Drivers ║ ╚══════════════════════════════════════════════════════════════════════════════╝ Target: esp32c6 ESP-IDF Version: v5.5.0

╔══════════════════════════════════════════════════════════════════════════════╗ ║ TLE92466ED TEST CONFIGURATION
╠══════════════════════════════════════════════════════════════════════════════╣ ║ Test sections will execute based on compile-time configuration ║ ║ GPIO14 test progression indicator: ENABLED ║ ╚══════════════════════════════════════════════════════════════════════════════╝ ```text

Test Execution

```text ╔══════════════════════════════════════════════════════════════════════════════╗ ║ SECTION: INITIALIZATION TESTS ║ ╚══════════════════════════════════════════════════════════════════════════════╝ [GPIO14: Blink pattern - 5 blinks]

╔══════════════════════════════════════════════════════════════════════════════╗ ║ Running (task): hal_initialization ║ ╚══════════════════════════════════════════════════════════════════════════════╝ I (1234) TLE92466ED_Basic: Creating HAL instance… I (1235) ESP32C6_HAL: ESP32C6_HAL created with SPI config I (1236) ESP32C6_HAL: MISO: GPIO2, MOSI: GPIO7, SCLK: GPIO6, CS: GPIO10 I (1237) ESP32C6_HAL: Frequency: 1000000 Hz, Mode: 0 I (1238) TLE92466ED_Basic: Initializing HAL… I (1240) ESP32C6_HAL: ESP32C6_HAL initialized successfully I (1241) TLE92466ED_Basic: ✅ HAL initialized successfully [SUCCESS] PASSED (task): hal_initialization (12.34 ms) Test task completed: hal_initialization [GPIO14: Toggle HIGH]

╔══════════════════════════════════════════════════════════════════════════════╗ ║ Running (task): driver_initialization ║ ╚══════════════════════════════════════════════════════════════════════════════╝ I (1250) TLE92466ED_Basic: Creating TLE92466ED driver instance… I (1251) TLE92466ED_Basic: Initializing TLE92466ED driver… I (1275) TLE92466ED_Basic: ✅ TLE92466ED driver initialized successfully [SUCCESS] PASSED (task): driver_initialization (25.67 ms) Test task completed: driver_initialization [GPIO14: Toggle LOW]

╔══════════════════════════════════════════════════════════════════════════════╗ ║ Running (task): chip_id ║ ╚══════════════════════════════════════════════════════════════════════════════╝ I (1280) TLE92466ED_Basic: Reading chip identification… I (1285) TLE92466ED_Basic: ✅ Chip ID: 0x123456789ABC [SUCCESS] PASSED (task): chip_id (5.23 ms) Test task completed: chip_id [GPIO14: Toggle HIGH] ```text

Test Results Summary

```text ╔══════════════════════════════════════════════════════════════════════════════╗ ║ TEST RESULTS SUMMARY ║ ╠══════════════════════════════════════════════════════════════════════════════╣ ║ Total Tests: 7 ║ ║ Passed: 7 ║ ║ Failed: 0 ║ ║ Success Rate: 100.00% ║ ║ Total Time: 234.56 ms ║ ╚══════════════════════════════════════════════════════════════════════════════╝

I (5000) TLE92466ED_Basic: ✅ ALL TESTS PASSED! System will restart in 10 seconds… ```text

GPIO14 Signal Pattern

text Time │ GPIO14 │ Event ────────┼────────┼────────────────────────────── 0ms │ LOW │ Boot 100ms │ BLINK │ Section start (5 blinks) │ ↑↓ │ 200ms │ HIGH │ Test 1 complete 300ms │ LOW │ Test 2 complete 400ms │ HIGH │ Test 3 complete 500ms │ BLINK │ Section 2 start (5 blinks) 600ms │ LOW │ Test 4 complete ...text

🧪 Individual Test Details

1. `test_hal_initialization()`

Purpose: Validate ESP32-C6 HAL creation and SPI initialization

Operations:

Create ESP32C6_HAL instance with configuration from TLE92466ED_Config.hpp
Initialize SPI peripheral (SPI2_HOST)
Configure GPIO pins for SPI
Set up SPI parameters (1MHz, Mode 0)

Expected Result: ✅ PASS

HAL instance created successfully
SPI bus initialized
GPIO pins configured
Ready for communication

Failure Modes:

SPI bus already initialized
GPIO pins in use
Invalid SPI configuration
Hardware fault

2. `test_driver_initialization()`

Purpose: Create TLE92466ED driver instance and initialize IC

Operations:

Create TLE92466ED driver instance with HAL reference
Execute driver initialization sequence
Configure TLE92466ED registers
Set up default parameters

Expected Result: ✅ PASS

Driver instance created
IC initialized successfully
Registers configured
Ready for operations

Failure Modes:

HAL not initialized
SPI communication failure
TLE92466ED not powered
IC initialization timeout

3. `test_chip_id()`

Purpose: Verify SPI communication by reading 48-bit chip ID

Operations:

Read chip identification register
Verify CRC-8 (SAE J1850)
Validate chip ID format

Expected Result: ✅ PASS

Chip ID read successfully
48-bit value displayed (e.g., 0x123456789ABC)
CRC verified

Failure Modes:

SPI communication error
CRC mismatch
Invalid chip ID
TLE92466ED not responding

4. `test_channel_enable_disable()`

Purpose: Validate channel control operations

Operations:

Enable channel 0
Wait 1 second
Disable channel 0
Verify register writes

Expected Result: ✅ PASS

Channel enabled successfully
Channel disabled successfully
No communication errors

Failure Modes:

Register write failure
SPI timeout
Invalid channel number

5. `test_current_setting()`

Purpose: Test current configuration at multiple setpoints

Operations: Test current settings at:

100mA
500mA
1000mA
1500mA

Expected Result: ✅ PASS

All current values set successfully
No register errors
500ms delay between steps

Failure Modes:

Current out of range (0-2000mA)
Register write failure
Invalid channel

6. `test_diagnostics()`

Purpose: Verify diagnostics reading and fault detection

Operations:

Read diagnostics registers
Check for faults:
- Overcurrent
- Overtemperature
- Open load
- Short circuit
Report status

Expected Result: ✅ PASS (no faults expected)

Diagnostics read successfully
“All systems normal” (assuming proper load)

Possible Warnings (not test failures):

⚠️ Overcurrent detected (load too high)
🌡️ Overtemperature detected (thermal issue)
🔌 Open load (no load connected)
⚡ Short circuit (load shorted)

Failure Modes:

Cannot read diagnostics
SPI communication error

7. `test_current_ramping()`

Purpose: Demonstrate smooth current transitions

Operations:

Enable channel 0
Ramp UP: 0mA → 1000mA (100mA steps, 300ms each)
Ramp DOWN: 1000mA → 0mA (100mA steps, 300ms each)
Disable channel 0

Expected Result: ✅ PASS

Smooth ramping completed
All current values set successfully
Channel disabled at end

Failure Modes:

Current setting failure
Channel enable/disable failure
Timeout during ramping

🐛 Troubleshooting

Common Issues

1. All Tests Fail ❌

Symptom: Every test returns FAILED

Root Causes:

TLE92466ED not powered (check VBAT: 12-24V)
SPI wiring incorrect
Common ground missing
ESP32-C6 not programmed correctly

Solutions: ```bash

Check wiring

VBAT: 12-24V present
VDD: 3.3V present
GND: Common ground between ESP32-C6, TLE92466ED, and power supply
SPI pins: MISO, MOSI, SCLK, CS connected correctly

Re-flash

idf.py -p /dev/ttyUSB0 erase-flash idf.py -p /dev/ttyUSB0 flash ```text

2. HAL Initialization Fails ❌

Symptom: test_hal_initialization fails

Root Causes:

SPI2 bus already in use
GPIO pins conflicting
Invalid SPI configuration

Solutions:

Check sdkconfig for SPI conflicts
Verify GPIO pins are not used elsewhere
Try different GPIO pins (modify TLE92466ED_Config.hpp)
Check ESP32-C6 hardware

3. Driver Initialization Fails ❌

Symptom: test_driver_initialization fails

Root Causes:

SPI communication not working
TLE92466ED not responding
Power supply issue

Solutions:

Verify SPI with logic analyzer/oscilloscope
Check VBAT voltage (must be 8-28V)
Check VDD voltage (must be 3.3V ±10%)
Verify TLE92466ED is not damaged

4. Chip ID Read Fails ❌

Symptom: test_chip_id fails, “Failed to read chip ID”

Root Causes:

SPI communication error
TLE92466ED not powered
CS pin not working

Solutions:

Measure SPI signals with oscilloscope:
- SCLK: Should show 1MHz clock during transactions
- MOSI: Should show data output
- MISO: Should show data input
- CS: Should go LOW during transactions
Check power supply voltages
Verify chip is not in reset or fault state

5. Diagnostics Show Faults ⚠️

Symptom: Tests pass but diagnostics show warnings

Overcurrent ⚠️:

Load drawing too much current
Check load resistance (should be ≥6Ω for 2A max)
Verify VBAT voltage

Overtemperature 🌡️:

IC too hot (>150°C junction temp)
Add heatsink
Reduce duty cycle
Lower ambient temperature

Open Load 🔌:

No load connected (expected if testing without load)
Loose connection
Load resistance too high

Short Circuit ⚡:

Load or wiring shorted to ground
Check continuity
Inspect for solder bridges

6. Current Ramping Fails ❌

Symptom: test_current_ramping fails midway

Root Causes:

Load specification issue
Power supply can’t deliver current
Thermal shutdown during ramp

Solutions:

Use proper test load (resistor: 6-120Ω, 5W+)
Ensure power supply can deliver 2A+
Monitor diagnostics during ramp
Add cooling if needed

Debug Configuration

Enable Verbose Logging

In sdkconfig: ini CONFIG_LOG_DEFAULT_LEVEL_DEBUG=y CONFIG_ESP_SYSTEM_PANIC_PRINT_HALT=ytext

Or via menuconfig: ```bash idf.py menuconfig

Component config -> Log output -> Default log verbosity -> Debug

```text

SPI Signal Analysis

Use logic analyzer to verify:

SCLK: 1MHz square wave during transactions
CS: Active LOW during transactions
MOSI/MISO: Data patterns visible
Timing: Mode 0 (CPOL=0, CPHA=0)

GPIO14 Monitoring

Attach oscilloscope to GPIO14:

Should toggle after each test
Should show blink patterns at section boundaries
Indicates test progression even if serial output fails

📈 Performance Characteristics

Typical Execution Times

Test	Expected Time	Max Time
HAL Initialization	10-15 ms	50 ms
Driver Initialization	20-30 ms	100 ms
Chip ID Read	5-10 ms	20 ms
Channel Enable/Disable	15-25 ms	50 ms
Current Setting (4 values)	40-60 ms	100 ms
Diagnostics Read	10-15 ms	30 ms
Current Ramping	60-80 ms	150 ms
Total Suite	200-250 ms	500 ms

Memory Usage

Resource	Usage	Notes
Flash	~55KB	Driver + HAL + test framework
RAM (static)	~12KB	Driver instance + buffers
Stack (per task)	8KB	Configurable in `RUN_TEST_IN_TASK`
Heap (dynamic)	~4KB	HAL instance + std::unique_ptr

SPI Performance

Clock Frequency: 1MHz (configurable 100kHz - 8MHz)
Transaction Time: ~32μs per 32-bit frame
Register Read: ~100μs (including overhead)
Register Write: ~80μs (including overhead)

ESP32 Examples

Multi-Channel Test Suite - Multiple channel control tests
Test Framework Reference - Framework API
Hardware Configuration - Pin and parameter config
ESP32-C6 HAL - HAL implementation details

Driver Documentation

Driver API Reference - Complete API documentation
HAL Implementation Guide - Porting to new platforms
Register Map - TLE92466ED register details
Diagnostics - Fault detection and handling

Build System

App Configuration - Build metadata
CMake Setup - Build system configuration
Component Structure - ESP-IDF component

🎓 Learning Path

Beginner

✅ Start Here: Basic Usage Test Suite
Run tests and observe GPIO14 indicators
Modify test current values
Try with different loads

Intermediate

Modify TLE92466ED_Config.hpp for custom hardware
Add new test functions
Configure test sections
Analyze SPI signals with oscilloscope

Advanced

Implement custom HAL for different MCU
Extend test framework for CI/CD
Create application-specific tests
Optimize performance and memory

📊 CI/CD Integration

Structured Output

The test suite produces structured output suitable for parsing:

text [SUCCESS] PASSED (task): test_name (12.34 ms) [FAILED] FAILED (task): test_name (45.67 ms)text

Exit Codes

0: All tests passed
Non-zero: Tests failed (after restart)

Parsing Results

```bash

Extract pass/fail count

grep “Total Tests:” output.log grep “Success Rate:” output.log

Check for failures

grep “[FAILED]” output.log && echo “Tests failed!” || echo “All passed!” ```text

Example: Basic Usage Test Suite
Platform: ESP32-C6
Framework: FreeRTOS + Test Framework
Complexity: ⭐⭐⭐☆☆
Status: ✅ Production Ready

Basic Usage Test Suite - TLE92466ED ESP32-C6

Overview

🎯 Purpose

🧪 Test Framework Architecture

Professional Test Infrastructure

✅ FreeRTOS Task-Based Execution

✅ GPIO14 Progress Indicator

✅ Automatic Result Tracking

✅ Test Section Management

📋 Test Suite Structure

Test Sections

1. INITIALIZATION_TESTS (#define ENABLE_INITIALIZATION_TESTS 1)

2. BASIC_OPERATION_TESTS (#define ENABLE_BASIC_OPERATION_TESTS 1)

3. CURRENT_CONTROL_TESTS (#define ENABLE_CURRENT_CONTROL_TESTS 1)

Test Function Signatures

🔧 Hardware Setup

Required Components

Wiring Diagram

Complete Pin Configuration

GPIO14 Test Indicator Setup

⚙️ Configuration

Hardware Configuration (main/TLE92466ED_Config.hpp)

Test Configuration (main/BasicUsageExample.cpp)

Build Configuration (app_config.yml)

🚀 Building and Running

Quick Start

Build the basic usage example

Flash to ESP32-C6

Monitor output

Manual Build

Set target

Configure (optional)

Build with APP_TYPE=basic_usage

Flash

Monitor

Build Targets

Debug build (optimized for debugging)

Release build (optimized for performance)

📊 Expected Output

Professional Test Header

Test Execution

Test Results Summary

GPIO14 Signal Pattern

🧪 Individual Test Details

1. test_hal_initialization()

2. test_driver_initialization()

3. test_chip_id()

4. test_channel_enable_disable()

5. test_current_setting()

6. test_diagnostics()

7. test_current_ramping()

🐛 Troubleshooting

Common Issues

1. All Tests Fail ❌

Check wiring

Re-flash

2. HAL Initialization Fails ❌

3. Driver Initialization Fails ❌

4. Chip ID Read Fails ❌

5. Diagnostics Show Faults ⚠️

6. Current Ramping Fails ❌

Debug Configuration

Enable Verbose Logging

Component config -> Log output -> Default log verbosity -> Debug

SPI Signal Analysis

GPIO14 Monitoring

📈 Performance Characteristics

Typical Execution Times

Memory Usage

SPI Performance

🔗 Related Documentation

ESP32 Examples

Driver Documentation

Build System

🎓 Learning Path

Beginner

Intermediate

Advanced

📊 CI/CD Integration

Structured Output

1. INITIALIZATION_TESTS (`#define ENABLE_INITIALIZATION_TESTS 1`)

2. BASIC_OPERATION_TESTS (`#define ENABLE_BASIC_OPERATION_TESTS 1`)

3. CURRENT_CONTROL_TESTS (`#define ENABLE_CURRENT_CONTROL_TESTS 1`)

Hardware Configuration (`main/TLE92466ED_Config.hpp`)

Test Configuration (`main/BasicUsageExample.cpp`)

Build Configuration (`app_config.yml`)

1. `test_hal_initialization()`

2. `test_driver_initialization()`

3. `test_chip_id()`

4. `test_channel_enable_disable()`

5. `test_current_setting()`

6. `test_diagnostics()`

7. `test_current_ramping()`