Comprehensive GPIO testing suite for ESP32-C6 DevKit-M-1 (noexcept) More...

#include "utils/AsciiArtGenerator.h"
#include "utils/memory_utils.h"
#include "base/BaseGpio.h"
#include "mcu/esp32/EspGpio.h"
#include "mcu/esp32/utils/EspTypes_GPIO.h"
#include <memory>
#include <vector>
#include "TestFramework.h"

Include dependency graph for GpioComprehensiveTest.cpp:

Namespaces
namespace	TestPins

Functions
bool	test_basic_gpio_functionality () noexcept
	Test basic GPIO functionality including initialization and basic operations.

bool	test_gpio_initialization_and_configuration () noexcept
	Test GPIO initialization and configuration modes.

bool	test_gpio_input_output_operations () noexcept
	Test GPIO input/output operations and state management.

bool	test_gpio_pull_resistors () noexcept
	Test GPIO pull resistor functionality.

bool	test_gpio_interrupt_functionality () noexcept
	Test GPIO interrupt functionality.

bool	test_gpio_interrupt_loopback () noexcept

bool	test_gpio_advanced_features () noexcept
	Test advanced GPIO features (ESP32-C6 specific)

bool	test_gpio_rtc_functionality () noexcept
	Test RTC GPIO functionality for low-power operations.

bool	test_gpio_glitch_filters () noexcept
	Test other advanced GPIO functions - placeholders for comprehensive testing.

bool	test_gpio_sleep_and_wakeup () noexcept

bool	test_gpio_hold_functionality () noexcept

bool	test_gpio_drive_capabilities () noexcept

bool	test_gpio_diagnostics_and_statistics () noexcept

bool	test_gpio_error_handling () noexcept

bool	test_gpio_stress_testing () noexcept

bool	test_gpio_pin_validation () noexcept

bool	test_gpio_loopback_operations () noexcept

bool	test_gpio_concurrent_operations () noexcept

bool	test_gpio_power_consumption () noexcept

static void IRAM_ATTR	gpio_isr_loopback_cb (BaseGpio , hf_gpio_interrupt_trigger_t, void )

void	app_main (void)
	Main application entry point.

Variables
static const char *	TAG = "GPIO_Test"

static constexpr hf_pin_num_t	TestPins::LED_OUTPUT = 14

static constexpr hf_pin_num_t	TestPins::DIGITAL_OUT_1 = 4

static constexpr hf_pin_num_t	TestPins::DIGITAL_OUT_2 = 23

static constexpr hf_pin_num_t	TestPins::DIGITAL_IN_1 = 2

static constexpr hf_pin_num_t	TestPins::DIGITAL_IN_2 = 17

static constexpr hf_pin_num_t	TestPins::INTERRUPT_PIN = 2

static constexpr hf_pin_num_t	TestPins::PULL_TEST_PIN = 17

static constexpr hf_pin_num_t	TestPins::DRIVE_TEST_PIN = 16

static constexpr hf_pin_num_t	TestPins::RTC_GPIO_PIN = 5

static constexpr hf_pin_num_t	TestPins::ANALOG_PIN = 4

static constexpr hf_pin_num_t	TestPins::LOOPBACK_OUT = 19

static constexpr hf_pin_num_t	TestPins::LOOPBACK_IN = 20

static constexpr hf_pin_num_t	TestPins::STRESS_TEST_PIN = 23

static TestResults	g_test_results

static constexpr bool	ENABLE_CORE_TESTS

static constexpr bool	ENABLE_INTERRUPT_TESTS = true

static constexpr bool	ENABLE_ADVANCED_TESTS = true

static constexpr bool	ENABLE_ESP_SPECIFIC_TESTS

static constexpr bool	ENABLE_ROBUSTNESS_TESTS = true

static constexpr bool	ENABLE_SPECIALIZED_TESTS

static volatile uint32_t	s_isr_loopback_count = 0
	Test ISR callback handling using loopback between output and input pins.

Detailed Description

Comprehensive GPIO testing suite for ESP32-C6 DevKit-M-1 (noexcept)

This file contains a unified, comprehensive test suite for the EspGpio class targeting ESP32-C6 with ESP-IDF v5.5+. It provides thorough testing of all GPIO functionalities including basic operations, advanced features, interrupts, power management, and hardware-specific capabilities.

All functions are noexcept - no exception handling used.

Author: Nebiyu Tadesse

Date: 2025

Copyright: HardFOC

Function Documentation

◆ app_main()

void app_main ( void )

Main application entry point.

◆ gpio_isr_loopback_cb()

static void IRAM_ATTR gpio_isr_loopback_cb	(	BaseGpio *	,
		hf_gpio_interrupt_trigger_t	,
		void *	)

static

◆ test_basic_gpio_functionality()

bool test_basic_gpio_functionality ( )

noexcept

Test basic GPIO functionality including initialization and basic operations.

◆ test_gpio_advanced_features()

bool test_gpio_advanced_features ( )

noexcept

Test advanced GPIO features (ESP32-C6 specific)

◆ test_gpio_concurrent_operations()

bool test_gpio_concurrent_operations ( )

noexcept

◆ test_gpio_diagnostics_and_statistics()

bool test_gpio_diagnostics_and_statistics ( )

noexcept

◆ test_gpio_drive_capabilities()

bool test_gpio_drive_capabilities ( )

noexcept

◆ test_gpio_error_handling()

bool test_gpio_error_handling ( )

noexcept

◆ test_gpio_glitch_filters()

bool test_gpio_glitch_filters ( )

noexcept

Test other advanced GPIO functions - placeholders for comprehensive testing.

◆ test_gpio_hold_functionality()

bool test_gpio_hold_functionality ( )

noexcept

◆ test_gpio_initialization_and_configuration()

bool test_gpio_initialization_and_configuration ( )

noexcept

Test GPIO initialization and configuration modes.

◆ test_gpio_input_output_operations()

bool test_gpio_input_output_operations ( )

noexcept

Test GPIO input/output operations and state management.

◆ test_gpio_interrupt_functionality()

bool test_gpio_interrupt_functionality ( )

noexcept

Test GPIO interrupt functionality.

◆ test_gpio_interrupt_loopback()

bool test_gpio_interrupt_loopback ( )

noexcept

◆ test_gpio_loopback_operations()

bool test_gpio_loopback_operations ( )

noexcept

◆ test_gpio_pin_validation()

bool test_gpio_pin_validation ( )

noexcept

◆ test_gpio_power_consumption()

bool test_gpio_power_consumption ( )

noexcept

◆ test_gpio_pull_resistors()

bool test_gpio_pull_resistors ( )

noexcept

Test GPIO pull resistor functionality.

◆ test_gpio_rtc_functionality()

bool test_gpio_rtc_functionality ( )

noexcept

Test RTC GPIO functionality for low-power operations.

◆ test_gpio_sleep_and_wakeup()

bool test_gpio_sleep_and_wakeup ( )

noexcept

◆ test_gpio_stress_testing()

bool test_gpio_stress_testing ( )

noexcept

Variable Documentation

◆ ENABLE_ADVANCED_TESTS

constexpr bool ENABLE_ADVANCED_TESTS = true

staticconstexpr

◆ ENABLE_CORE_TESTS

constexpr bool ENABLE_CORE_TESTS

staticconstexpr

Initial value:

=

true

◆ ENABLE_ESP_SPECIFIC_TESTS

constexpr bool ENABLE_ESP_SPECIFIC_TESTS

staticconstexpr

Initial value:

=

true

◆ ENABLE_INTERRUPT_TESTS

constexpr bool ENABLE_INTERRUPT_TESTS = true

staticconstexpr

◆ ENABLE_ROBUSTNESS_TESTS

constexpr bool ENABLE_ROBUSTNESS_TESTS = true

staticconstexpr

◆ ENABLE_SPECIALIZED_TESTS

constexpr bool ENABLE_SPECIALIZED_TESTS

staticconstexpr

Initial value:

=

true

◆ g_test_results

TestResults g_test_results

static

◆ s_isr_loopback_count

volatile uint32_t s_isr_loopback_count = 0

static

Test ISR callback handling using loopback between output and input pins.

◆ TAG

const char* TAG = "GPIO_Test"

static

Namespaces

Functions

Variables

Detailed Description

Function Documentation

◆ app_main()

◆ gpio_isr_loopback_cb()

◆ test_basic_gpio_functionality()

◆ test_gpio_advanced_features()

◆ test_gpio_concurrent_operations()

◆ test_gpio_diagnostics_and_statistics()

◆ test_gpio_drive_capabilities()

◆ test_gpio_error_handling()

◆ test_gpio_glitch_filters()

◆ test_gpio_hold_functionality()

◆ test_gpio_initialization_and_configuration()

◆ test_gpio_input_output_operations()

◆ test_gpio_interrupt_functionality()

◆ test_gpio_interrupt_loopback()

◆ test_gpio_loopback_operations()

◆ test_gpio_pin_validation()

◆ test_gpio_power_consumption()

◆ test_gpio_pull_resistors()

◆ test_gpio_rtc_functionality()

◆ test_gpio_sleep_and_wakeup()

◆ test_gpio_stress_testing()

Variable Documentation

◆ ENABLE_ADVANCED_TESTS

◆ ENABLE_CORE_TESTS

◆ ENABLE_ESP_SPECIFIC_TESTS

◆ ENABLE_INTERRUPT_TESTS

◆ ENABLE_ROBUSTNESS_TESTS

◆ ENABLE_SPECIALIZED_TESTS

◆ g_test_results

◆ s_isr_loopback_count

◆ TAG